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Volumn 21, Issue 21, 2013, Pages 24692-24701
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Non-iterative determination of pattern phase in structured illumination microscopy using auto-correlations in Fourier space
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Author keywords
[No Author keywords available]
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Indexed keywords
FOURIER TRANSFORMS;
CROSS-CORRELATIONS;
FOURIER IMAGES;
FOURIER SPACE;
NON-ITERATIVE TECHNIQUES;
OPTIMISATIONS;
SIGNAL TO NOISE;
STRUCTURED ILLUMINATION MICROSCOPY;
YIELDING ERRORS;
ITERATIVE METHODS;
ALGORITHM;
ARTICLE;
COMPUTER ASSISTED DIAGNOSIS;
FOURIER ANALYSIS;
ILLUMINATION;
IMAGE ENHANCEMENT;
METHODOLOGY;
MICROSCOPY;
SIGNAL NOISE RATIO;
ALGORITHMS;
FOURIER ANALYSIS;
IMAGE ENHANCEMENT;
IMAGE INTERPRETATION, COMPUTER-ASSISTED;
LIGHTING;
MICROSCOPY;
SIGNAL-TO-NOISE RATIO;
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EID: 84886407143
PISSN: None
EISSN: 10944087
Source Type: Journal
DOI: 10.1364/OE.21.024692 Document Type: Article |
Times cited : (109)
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References (10)
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