메뉴 건너뛰기




Volumn 8153 LNCS, Issue , 2013, Pages 265-276

A study of the impact of single bit-flip and double bit-flip errors on program execution

Author keywords

double bit flips; error sensitivity; fault injection; out of context dependability benchmarking; single bit flips

Indexed keywords

BENCHMARK PROGRAMS; BIT-FLIPS; ERROR SENSITIVITY; FAULT INJECTION; INSTRUCTION SET ARCHITECTURE; MEMORY LOCATIONS; PROGRAM EXECUTION; SILENT DATA CORRUPTIONS;

EID: 84886379889     PISSN: 03029743     EISSN: 16113349     Source Type: Book Series    
DOI: 10.1007/978-3-642-40793-2_24     Document Type: Conference Paper
Times cited : (39)

References (18)
  • 1
    • 84886422833 scopus 로고    scopus 로고
    • accessed 2012
    • ISO Standard, http://www.iso.org/iso/catalogue-detail?csnumber=43464 (accessed 2012)
  • 3
    • 34247891689 scopus 로고    scopus 로고
    • Negative bias temperature instability: What do we understand?
    • Schroder, D.K.: Negative bias temperature instability: What do we understand? Microelectronics Reliability 47(6), 841-852 (2007)
    • (2007) Microelectronics Reliability , vol.47 , Issue.6 , pp. 841-852
    • Schroder, D.K.1
  • 4
    • 84886382359 scopus 로고    scopus 로고
    • Version 1.0
    • MiBench Version 1.0, University of Michigan, http://www.eecs.umich.edu/ mibench/
    • MiBench
  • 7
    • 1542328296 scopus 로고    scopus 로고
    • IEEE-ISTO
    • Nexus 5001™ Forum, IEEE-ISTO (1999), http://www.nexus5001.org/
    • (1999) Nexus 5001™ Forum
  • 8
    • 24944587987 scopus 로고    scopus 로고
    • Assembly-level pre-injection analysis for improving fault injection efficiency
    • Dal Cin, M., Kaâniche, M., Pataricza, A. (eds.) EDCC 2005. Springer, Heidelberg
    • Barbosa, R., Vinter, J., Folkesson, P., Karlsson, J.M.: Assembly-level pre-injection analysis for improving fault injection efficiency. In: Dal Cin, M., Kaâniche, M., Pataricza, A. (eds.) EDCC 2005. LNCS, vol. 3463, pp. 246-262. Springer, Heidelberg (2005)
    • (2005) LNCS , vol.3463 , pp. 246-262
    • Barbosa, R.1    Vinter, J.2    Folkesson, P.3    Karlsson, J.M.4
  • 9
    • 84859516565 scopus 로고
    • RIFLE: A general purpose pin-level fault injector
    • Echtle, K., Powell, D.R., Hammer, D. (eds.) EDCC 1994. Springer, Heidelberg
    • Madeira, H., Rela, M.Z., Moreira, F., Silva, G.J.: RIFLE: A general purpose pin-level fault injector. In: Echtle, K., Powell, D.R., Hammer, D. (eds.) EDCC 1994. LNCS, vol. 852, pp. 197-216. Springer, Heidelberg (1994)
    • (1994) LNCS , vol.852 , pp. 197-216
    • Madeira, H.1    Rela, M.Z.2    Moreira, F.3    Silva, G.J.4
  • 11
    • 0142156609 scopus 로고    scopus 로고
    • Non-intrusive Software-Implemented Fault Injection in Embedded Systems
    • de Lemos, R., Weber, T.S., Camargo Jr., J.B. (eds.) LADC 2003. Springer, Heidelberg
    • Yuste, P., Ruiz, J.C., Lemus, L., Gil, P.: Non-intrusive Software-Implemented Fault Injection in Embedded Systems. In: de Lemos, R., Weber, T.S., Camargo Jr., J.B. (eds.) LADC 2003. LNCS, vol. 2847, pp. 23-38. Springer, Heidelberg (2003)
    • (2003) LNCS , vol.2847 , pp. 23-38
    • Yuste, P.1    Ruiz, J.C.2    Lemus, L.3    Gil, P.4
  • 13
    • 36348947597 scopus 로고    scopus 로고
    • Study of the Effects of SEUInduced Faults on a Pipeline Protected Microprocessor
    • Touloupis, E., Flint, J.A., Chouliaras, V.A., Ward, D.D.: Study of the Effects of SEUInduced Faults on a Pipeline Protected Microprocessor. IEEE Transactions on Computers 56(12), 1585-1596 (2007)
    • (2007) IEEE Transactions on Computers , vol.56 , Issue.12 , pp. 1585-1596
    • Touloupis, E.1    Flint, J.A.2    Chouliaras, V.A.3    Ward, D.D.4
  • 14
    • 84867593155 scopus 로고    scopus 로고
    • On the Impact of Hardware Faults - An Investigation of the Relationship between Workload Inputs and Failure Mode Distributions
    • Ortmeier, F., Lipaczewski, M. (eds.) SAFECOMP 2012. Springer, Heidelberg
    • Di Leo, D., Ayatolahi, F., Sangchoolie, B., Karlsson, J., Johansson, R.: On the Impact of Hardware Faults - An Investigation of the Relationship between Workload Inputs and Failure Mode Distributions. In: Ortmeier, F., Lipaczewski, M. (eds.) SAFECOMP 2012. LNCS, vol. 7612, pp. 198-209. Springer, Heidelberg (2012)
    • (2012) LNCS , vol.7612 , pp. 198-209
    • Di Leo, D.1    Ayatolahi, F.2    Sangchoolie, B.3    Karlsson, J.4    Johansson, R.5
  • 18
    • 0033737766 scopus 로고    scopus 로고
    • Geometric Effect of Multiple-Bit Soft Errors Induced by Cosmic Ray Neutrons on DRAM's
    • Satoh, S., Tosaka, Y., Wender, S.A.: Geometric Effect of Multiple-Bit Soft Errors Induced by Cosmic Ray Neutrons on DRAM's. Electron Device Letters 21(6), 310-312 (2000)
    • (2000) Electron Device Letters , vol.21 , Issue.6 , pp. 310-312
    • Satoh, S.1    Tosaka, Y.2    Wender, S.A.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.