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Volumn , Issue , 2008, Pages 145-154

Software implemented detection and recovery of soft errors in a brake-by-wire system

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER NETWORKS; ERROR CORRECTION; ERRORS; MECHANISMS; WIRE;

EID: 51549101023     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/EDCC-7.2008.24     Document Type: Conference Paper
Times cited : (33)

References (24)
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    • Barbosa, R.1    Vinter, J.2    Folkesson, P.3    Karlsson, J.4
  • 4
    • 33846118079 scopus 로고    scopus 로고
    • Designing reliable systems from unreliable components: The challenges of transistor variability and degradation
    • S. Borkar. Designing reliable systems from unreliable components: The challenges of transistor variability and degradation. IEEE Micro, 25(6):10-16, 2005.
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    • Borkar, S.1
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    • Dynamic dead-instruction detection and elimination
    • J. Butts and G. Sohi. Dynamic dead-instruction detection and elimination. ACM SIGPLAN Notices, 37(10): 199-210, 2002.
    • (2002) ACM SIGPLAN Notices , vol.37 , Issue.10 , pp. 199-210
    • Butts, J.1    Sohi, G.2
  • 8
    • 0031997409 scopus 로고    scopus 로고
    • Anti-windup and bumpless-transfer schemes
    • C. Edwards and I. Postlethwaite. Anti-windup and bumpless-transfer schemes. Automatica, 34(2): 199-210, 1998.
    • (1998) Automatica , vol.34 , Issue.2 , pp. 199-210
    • Edwards, C.1    Postlethwaite, I.2
  • 10
    • 0026122066 scopus 로고
    • What every computer scientist should know about floating-point arithmetic
    • D. Goldberg. What every computer scientist should know about floating-point arithmetic. ACM Computing Surveys, 23(1):5-48, 1991.
    • (1991) ACM Computing Surveys , vol.23 , Issue.1 , pp. 5-48
    • Goldberg, D.1
  • 12
    • 17644440390 scopus 로고    scopus 로고
    • P. Hazucha, T. Karnik, J. Maiz, S. Walstra, B. Bloechel, J. Tschanz, G. Dermer, S. Hareland, P. Armstrong, and S. Borkar. Neutron Soft Error Rate Measurements in a 90-nm CMOS Process and Scaling Trends in SRAM from 0.25-μm to 90-nm Generation. In Proc. International Electron Devices Meeting (IEDM 2003), pages 21.5.1-21.5.4, 2003.
    • P. Hazucha, T. Karnik, J. Maiz, S. Walstra, B. Bloechel, J. Tschanz, G. Dermer, S. Hareland, P. Armstrong, and S. Borkar. Neutron Soft Error Rate Measurements in a 90-nm CMOS Process and Scaling Trends in SRAM from 0.25-μm to 90-nm Generation. In Proc. International Electron Devices Meeting (IEDM 2003), pages 21.5.1-21.5.4, 2003.
  • 15
    • 51549110766 scopus 로고    scopus 로고
    • JEDEC Standard JESD89A. Measurement and Reporting of Alpha Particle and Terrestrial Cosmic Ray-Induced Soft Errors in Semiconductor Devices, Oct. 2006.
    • JEDEC Standard JESD89A. Measurement and Reporting of Alpha Particle and Terrestrial Cosmic Ray-Induced Soft Errors in Semiconductor Devices, Oct. 2006.
  • 17
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    • Software detection mechanisms providing full coverage against single bit-flip faults
    • Dec
    • B. Nicolescu, Y. Savaria, and R. Velazco. Software detection mechanisms providing full coverage against single bit-flip faults. IEEE Transactions on Nuclear Science, 51(6):3510-3518, Dec. 2004.
    • (2004) IEEE Transactions on Nuclear Science , vol.51 , Issue.6 , pp. 3510-3518
    • Nicolescu, B.1    Savaria, Y.2    Velazco, R.3
  • 21
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    • The Second Workshop on Silicon Errors in Logic - System Effects (SELSE 2). Workshop summary available at http://selse2.selse.org/recap.pdf. Apr. 2006.
    • The Second Workshop on Silicon Errors in Logic - System Effects (SELSE 2). Workshop summary available at http://selse2.selse.org/recap.pdf. Apr. 2006.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.