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Volumn , Issue , 2013, Pages 269-312

Cluster TOF-SIMS Imaging and the Characterization of Biological Materials

Author keywords

Biological materials; Cluster primary ions; Three dimensional imaging; Time of flight secondary ion mass spectrometry (ToF SIMS)

Indexed keywords


EID: 84886329219     PISSN: None     EISSN: None     Source Type: Book    
DOI: 10.1002/9781118589335.ch8     Document Type: Chapter
Times cited : (15)

References (59)
  • 31
    • 84890674943 scopus 로고    scopus 로고
    • 2nd ed., Vickerman, J. C., Gilmore, I. S., Eds.; John Wiley & Sons, Ltd: Chichester, UK
    • Lee, J. L. S.; Gilmore, I. S. In Surface Analysis - The Principal Techniques, 2nd ed.; Vickerman, J. C., Gilmore, I. S., Eds.; John Wiley & Sons, Ltd: Chichester, UK, 2009; pp 563-613.
    • (2009) Surface Analysis - The Principal Techniques , pp. 563-613
    • Lee, J.L.S.1    Gilmore, I.S.2
  • 34
    • 0022812588 scopus 로고
    • Briggs, D.; Hearn, M. J. Vacuum 1986, 36 (11-12), 1005-1010.
    • (1986) J. Vacuum , vol.36 , Issue.11-12 , pp. 1005-1010
    • Briggs, D.1    Hearn, M.2
  • 48
    • 79956094222 scopus 로고    scopus 로고
    • Vickerman, J. C. Analyst 2011, 136 (11), 2199-2217.
    • (2011) Analyst , vol.136 , Issue.11 , pp. 2199-2217
    • Vickerman, J.C.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.