Thermal and electrical conduction in ultrathin metallic films: 7 nm down to sub-nanometer thickness

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Volumn 9, Issue 15, 2013, Pages 2585-2594

  Lin, Huan ^a,b   Xu, Shen ^a   Wang, Xinwei ^a   Mei, Ning ^b  

^a Iowa State University   (United States)

^b OCEAN UNIVERSITY OF CHINA   (China)

Author keywords

electrical conductivity; iridium films; Lorenz number; thermal conductivity; ultrathin films

Indexed keywords

ELECTRICAL CONDUCTION; ELECTRICAL CONDUCTIVITY; LORENZ NUMBER; MAYADAS-SHATZKES MODEL; SUB NANOMETERS; THERMAL TRANSPORT; ULTRA-THIN; ULTRATHIN METALLIC FILMS;

ELECTRON REFLECTION; GRAIN BOUNDARIES; IRIDIUM; METALLIC FILMS; THERMAL CONDUCTIVITY; ULTRATHIN FILMS;

THERMAL CONDUCTIVITY OF SOLIDS;

EID: 84886022341     PISSN: 16136810     EISSN: 16136829     Source Type: Journal    
DOI: 10.1002/smll.201202877     Document Type: Article

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