Thermophysical properties of free-standing micrometer-thick Poly(3-hexylthiophene) films

Thin Solid Films

Volumn 519, Issue 16, 2011, Pages 5700-5705

  Feng, Xuhui ^a   Wang, Xinwei ^a  

^a Iowa State University   (United States)

Author keywords

Density; Organic semiconductors; Poly(3 hexylthiophene); Thermal conductivity; Thin films; Transient electro thermal technique

Indexed keywords

DENSITY; EXPERIMENTAL DATA; ORGANIC SEMICONDUCTORS; POLY (3-HEXYLTHIOPHENE); RAMAN SPECTRUM; THERMO-PHYSICAL PROPERTY; WEIGHT PERCENTAGES;

CARRIER MOBILITY; RAMAN SPECTROSCOPY; THERMAL DIFFUSION; THERMAL DIFFUSIVITY; THERMODYNAMIC PROPERTIES; THIN FILMS; X RAY DIFFRACTION; X RAY DIFFRACTION ANALYSIS;

THERMAL CONDUCTIVITY OF SOLIDS;

EID: 79957972249     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.tsf.2011.03.043     Document Type: Article

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