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Volumn 25, Issue 10, 2004, Pages 696-698
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Numerical simulation of electron transport through constriction in a metallic thin film
a a a b |
Author keywords
[No Author keywords available]
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Indexed keywords
APPROXIMATION THEORY;
COMPUTER SIMULATION;
ELECTRIC CONDUCTIVITY;
ELECTRIC RESISTANCE;
ELECTRON SCATTERING;
ELECTRON TRANSPORT PROPERTIES;
INTEGRAL EQUATIONS;
METALLIC FILMS;
RELAXATION PROCESSES;
SURFACE PHENOMENA;
THICKNESS MEASUREMENT;
BOLTZMANN TRANSPORT EQUATION (BTE);
CONSTRICTION SIZE EFFECT;
ELECTRON SURFACE SCATTERING;
FINITE THICKNESS;
METALLIC THIN FILM;
ON-CHIP INTERCONNECTIONS;
RELAXATION TIME APPROXIMATION;
THIN FILM CIRCUIT INTERCONNECTIONS;
THIN FILM CIRCUITS;
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EID: 5044249232
PISSN: 07413106
EISSN: None
Source Type: Journal
DOI: 10.1109/LED.2004.835538 Document Type: Article |
Times cited : (12)
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References (11)
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