SCOPUS 정보 검색 플랫폼

Volumn 23, Issue 4, 2005, Pages 1412-1416

Electrical transport properties of ultrathin metallic films

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; ELECTRIC CONDUCTIVITY; MAGNETORESISTANCE; METALLIC FILMS; MORPHOLOGY; SURFACE ROUGHNESS;

FREE LAYER THICKNESS; PROBE MEASUREMENT; ULTRATHIN METALLIC FILMS; VACUUM SPUTTERING;

ULTRATHIN FILMS;

EID: 31344438149 PISSN: 10711023 EISSN: None Source Type: Journal
DOI: 10.1116/1.1935527 Document Type: Article

Times cited : (17)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.