Recognition of concurrent control chart patterns using wavelet transform decomposition and multiclass support vector machines

Computers and Industrial Engineering

Volumn 66, Issue 4, 2013, Pages 683-695

  Du, Shichang ^a   Huang, Delin ^a   Lv, Jun ^b  

^a SHANGHAI JIAO TONG UNIVERSITY   (China)

^b EAST CHINA NORMAL UNIVERSITY   (China)

Author keywords

Concurrent control chart pattern; Statistical process control; Support vector machine; Wavelet transform

Indexed keywords

CONCURRENT CONTROL; CONTROL CHART PATTERNS (CCPS); EFFECTIVE APPROACHES; MULTI-CLASS SUPPORT VECTOR MACHINES; PROCESS PERFORMANCE; STATISTICAL CORRELATION COEFFICIENT; STATISTICAL PROCESS CONTROL CHARTS; TRANSFORM DECOMPOSITIONS;

FLOWCHARTING; SIGNAL PROCESSING; STATISTICAL PROCESS CONTROL; WAVELET TRANSFORMS;

SUPPORT VECTOR MACHINES;

EID: 84886016841     PISSN: 03608352     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.cie.2013.09.012     Document Type: Article

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