Effects of manufacturing defects on the device failure rate

Journal of the Korean Statistical Society

Volumn 42, Issue 4, 2013, Pages 481-495

  Kim, Kyungmee O ^a  

^a Konkuk University   (South Korea)

Author keywords

Defect clustering; Defect growth; Infant mortality failures; Reliability

Indexed keywords

EID: 84885832958     PISSN: 12263192     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jkss.2013.02.003     Document Type: Article

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