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Statistics and Probability Letters
Volumn 49, Issue 2, 2000, Pages 155-161
A new two-parameter lifetime distribution with bathtub shape or increasing failure rate function
Author keywords

Bathtub shape; Exact confidence interval; Exact joint confidence region; Failure rate function; Lifetime model
Indexed keywords

EID: 0001137633     PISSN: 01677152     EISSN: None     Source Type: Journal    
DOI: 10.1016/s0167-7152(00)00044-4     Document Type: Article
Times cited : (323)
References (6)
  • 1
    • 0001327612 scopus 로고
    • Some theorems relevant to life testing from an exponential distribution
    • Epstein B., Sobel M. Some theorems relevant to life testing from an exponential distribution. Ann. Math. Statist. 25:1954;373-381.
    • (1954) Ann. Math. Statist. , vol.25 , pp. 373-381
    • Epstein, B.1    Sobel, M.2
  • 2
    • 0002026788 scopus 로고
    • Analytical hazard representations for use in reliability, mortality, and simulation studies
    • Gaver D.P., Acar M. Analytical hazard representations for use in reliability, mortality, and simulation studies. Comm. Statist. B. 8:1979;91-111.
    • (1979) Comm. Statist. B , vol.8 , pp. 91-111
    • Gaver, D.P.1    Acar, M.2
  • 3
    • 0018982982 scopus 로고
    • A reliability distribution with increasing, decreasing, and bathtub-shaped failure rate
    • Hjorth U. A reliability distribution with increasing, decreasing, and bathtub-shaped failure rate. Technometrics. 22:1980;99-107.
    • (1980) Technometrics , vol.22 , pp. 99-107
    • Hjorth, U.1
  • 4
    • 0022736625 scopus 로고
    • Lifetime distribution identities
    • Leemis L.M. Lifetime distribution identities. IEEE Trans. Reliability. 35:1986;170-174.
    • (1986) IEEE Trans. Reliability , vol.35 , pp. 170-174
    • Leemis, L.M.1
  • 5
    • 0027608675 scopus 로고
    • Exponentiated Weibull family for analyzing bathtub failure-rate data
    • Mudholkar G.S., Srivastava D.K. Exponentiated Weibull family for analyzing bathtub failure-rate data. IEEE Trans. Reliability. 42:1993;299-302.
    • (1993) IEEE Trans. Reliability , vol.42 , pp. 299-302
    • Mudholkar, G.S.1    Srivastava, D.K.2
  • 6
    • 0008496184 scopus 로고
    • An exponential power life-testing distribution
    • Smith R.M., Bain L.J. An exponential power life-testing distribution. Comm. Statist. 4:1975;469-481.
    • (1975) Comm. Statist. , vol.4 , pp. 469-481
    • Smith, R.M.1    Bain, L.J.2

* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.