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Volumn 56, Issue 2, 1997, Pages 151-159

Parametric study of sectional models involving two weibull distributions

Author keywords

[No Author keywords available]

Indexed keywords

FAILURE ANALYSIS; MATHEMATICAL MODELS; PROBABILITY DENSITY FUNCTION; WEIBULL DISTRIBUTION;

EID: 0031130628     PISSN: 09518320     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0951-8320(96)00114-7     Document Type: Article
Times cited : (15)

References (12)
  • 1
    • 0029379460 scopus 로고
    • Modeling failure data by mixture of two Weibull distributions: A graphical approach
    • Jiang, R. and Murthy, D. N. P., Modeling failure data by mixture of two Weibull distributions: a graphical approach. IEEE Transactions on Reliability, 1995, 44, 477-488.
    • (1995) IEEE Transactions on Reliability , vol.44 , pp. 477-488
    • Jiang, R.1    Murthy, D.N.P.2
  • 4
    • 0032028423 scopus 로고    scopus 로고
    • Mixture of Weibull distributions - Parametric characterization of failure rate function
    • accepted
    • Jiang, R. and Murthy, D. N. P., Mixture of Weibull distributions - parametric characterization of failure rate function. Applied Stochastic Models and Data Analysis (accepted).
    • Applied Stochastic Models and Data Analysis
    • Jiang, R.1    Murthy, D.N.P.2
  • 6
    • 0031084037 scopus 로고    scopus 로고
    • Parametric study of multiplicative model involving two Weibull distributions
    • accepted
    • Jiang, R. and Murthy, D. N. P., Parametric study of multiplicative model involving two Weibull distributions. Reliability Engineering and System Safety (accepted).
    • Reliability Engineering and System Safety
    • Jiang, R.1    Murthy, D.N.P.2
  • 7
    • 84914714246 scopus 로고
    • A graphical estimation of mixed Weibull parameters in life-testing of electron tubes
    • Kao, J. H. K. A graphical estimation of mixed Weibull parameters in life-testing of electron tubes. Technometrics, 1995, 1, 389-407.
    • (1995) Technometrics , vol.1 , pp. 389-407
    • Kao, J.H.K.1
  • 8
    • 0042128800 scopus 로고    scopus 로고
    • Sequential life tests for the exponential distribution with changing parameters
    • Aroian, L. A. and Robsion, D. E. Sequential life tests for the exponential distribution with changing parameters. Technometrics, 1996, 8, 217-227.
    • (1996) Technometrics , vol.8 , pp. 217-227
    • Aroian, L.A.1    Robsion, D.E.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.