Sample preparation for scanning Kelvin probe microscopy studies on cross sections of organic solar cells

AIP Advances

Volumn 3, Issue 9, 2013, Pages

  Scherer, Michael ^a,b,c   Saive, Rebecca ^a,b,c   Daume, Dominik ^a,b,c   Kröger, Michael ^a,b,c   Kowalsky, Wolfgang ^a,b,c  

^a UNIVERSITY OF HEIDELBERG   (Germany)

^b TECHNICAL UNIVERSITY OF BRAUNSCHWEIG   (Germany)

^c INNOVATIONLAB   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC FIELDS; HETEROJUNCTIONS; ION BEAMS; PROBES; SUBSTRATES;

BULK HETEROJUNCTION (BHJ); OPERATING CONDITION; PLASTIC SUBSTRATES; POTENTIAL DISTRIBUTIONS; POTENTIAL GRADIENTS; SAMPLE PREPARATION; SCANNING KELVIN PROBE MICROSCOPY; SHORT-CIRCUIT CONDITIONS;

ORGANIC SOLAR CELLS;

EID: 84885664341     PISSN: None     EISSN: 21583226     Source Type: Journal    
DOI: 10.1063/1.4824323     Document Type: Article

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