Impacts of test suite's class imbalance on spectrum-based fault localization techniques

Proceedings of the International Symposium on the Physical and Failure Analysis of Integrated Circuits, IPFA

Volumn , Issue , 2013, Pages 260-267

  Rao, Peifeng ^a   Zheng, Zheng ^a   Chen, Tsong Yueh ^b   Wang, Nan ^a   Cai, Kaiyuan ^a  

^a BEIHANG UNIVERSITY   (China)

^b SWINBURNE UNIVERSITY OF TECHNOLOGY   (Australia)

Author keywords

class imbalance; metamorphic slices; metamorphic testing; spectrum based fault localization; test oracle

Indexed keywords

CLASS IMBALANCE; FAULT LOCALIZATION; METAMORPHIC SLICES; METAMORPHIC TESTING; TEST ORACLES;

TESTING;

EID: 84885626367     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/QSIC.2013.18     Document Type: Conference Paper

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