-
1
-
-
71749095111
-
A practical evaluation of spectrum-based fault localization
-
R. Abreu, P. Zoeteweij, R. Golsteijn, and A.J.C. van Gemund A practical evaluation of spectrum-based fault localization Journal of Systems and Software 82 11 2009 1780 1792
-
(2009)
Journal of Systems and Software
, vol.82
, Issue.11
, pp. 1780-1792
-
-
Abreu, R.1
Zoeteweij, P.2
Golsteijn, R.3
Van Gemund, A.J.C.4
-
3
-
-
34247095930
-
Improving test suites for efficient fault localization
-
Proceeding of the 28th International Conference on Software Engineering 2006, ICSE '06
-
B. Baudry, F. Fleurey, and Y. Le Traon Improving test suites for efficient fault localization Proceedings of the 28th International Conference on Software Engineering (ICSE 2006) 2006 ACM Press New York, NY 82 91 (Pubitemid 46600905)
-
(2006)
Proceedings - International Conference on Software Engineering
, vol.2006
, pp. 82-91
-
-
Baudry, B.1
Fleurey, F.2
Le Traon, Y.3
-
5
-
-
71649102481
-
Adaptive random testing: The ART of test case diversity
-
T.Y. Chen, F.-C. Kuo, R.G. Merkel, and T.H. Tse Adaptive random testing: the ART of test case diversity Journal of Systems and Software 83 1 2010 60 66
-
(2010)
Journal of Systems and Software
, vol.83
, Issue.1
, pp. 60-66
-
-
Chen, T.Y.1
Kuo, F.-C.2
Merkel, R.G.3
Tse, T.H.4
-
7
-
-
34548652643
-
Quasi-random testing
-
DOI 10.1109/TR.2007.903293
-
T.Y. Chen, and R.G. Merkel Quasi-random testing IEEE Transactions on Reliability 56 3 2007 562 568 (Pubitemid 47399764)
-
(2007)
IEEE Transactions on Reliability
, vol.56
, Issue.3
, pp. 562-568
-
-
Chen, T.Y.1
Merkel, R.2
-
10
-
-
34247334247
-
Object distance and its application to adaptive random testing of object-oriented programs
-
DOI 10.1145/1145735.1145744, Proceedings of the 1st International Workshop on Random Testing, RT'06
-
I. Ciupa, A. Leitner, M. Oriol, and B. Meyer Object distance and its application to adaptive random testing of object-oriented programs Proceedings of the 1st International Workshop on Random Testing (in conjunction with the 2006 ACM SIGSOFT International Symposium on Software Testing and Analysis (ISSTA 2006)) 2006 ACM Press New York, NY 55 63 (Pubitemid 46645426)
-
(2006)
Proceedings of the 1st International Workshop on Random Testing, RT'06
, vol.2006
, pp. 55-63
-
-
Ciupa, I.1
Leitner, A.2
Oriol, M.3
Meyer, B.4
-
11
-
-
34548252841
-
Experimental assessment of random testing for object-oriented software
-
DOI 10.1145/1273463.1273476, Proceedings of the 2007 ACM International Symposium on Software Testing and Analysis, ISSTA'07
-
I. Ciupa, A. Leitner, M. Oriol, and B. Meyer Experimental assessment of random testing for object-oriented software Proceedings of the 2007 ACM SIGSOFT International Symposium on Software Testing and Analysis (ISSTA 2007) 2007 ACM Press New York, NY 84 94 (Pubitemid 47317582)
-
(2007)
2007 ACM International Symposium on Software Testing and Analysis, ISSTA'07
, pp. 84-94
-
-
Ciupa, I.1
Leitner, A.2
Oriol, M.3
Meyer, B.4
-
12
-
-
52449125806
-
ARTOO: Adaptive random testing for object-oriented software
-
ACM Press New York, NY
-
I. Ciupa, A. Leitner, M. Oriol, and B. Meyer ARTOO: adaptive random testing for object-oriented software Proceedings of the 30th International Conference on Software Engineering (ICSE 2008) 2008 ACM Press New York, NY 71 80
-
(2008)
Proceedings of the 30th International Conference on Software Engineering (ICSE 2008)
, pp. 71-80
-
-
Ciupa, I.1
Leitner, A.2
Oriol, M.3
Meyer, B.4
-
14
-
-
33750208158
-
On the use of mutation faults in empirical assessments of test case prioritization techniques
-
DOI 10.1109/TSE.2006.92
-
H. Do, and G. Rothermel On the use of mutation faults in empirical assessments of test case prioritization techniques IEEE Transactions on Software Engineering 32 9 2006 733 752 (Pubitemid 44604891)
-
(2006)
IEEE Transactions on Software Engineering
, vol.32
, Issue.9
, pp. 733-752
-
-
Do, H.1
Rothermel, G.2
-
17
-
-
3142772245
-
Selecting a cost-effective test case prioritization technique
-
DOI 10.1023/B:SQJO.0000034708.84524.22
-
S.G. Elbaum, G. Rothermel, S. Kanduri, and A.G. Malishevsky Selecting a cost-effective test case prioritization technique Software Quality Control 12 3 2004 185 210 (Pubitemid 38930558)
-
(2004)
Software Quality Journal
, vol.12
, Issue.3
, pp. 185-210
-
-
Elbaum, S.1
Rothermel, G.2
Kanduri, S.3
Malishevsky, A.G.4
-
20
-
-
84862798389
-
-
Software Engineering Research Group, Delft University of Technology, Delft, the Netherlands
-
Gonzalez-Sanchez, R. Abreu, H.-G. Gross, A. van Gemund, A diagnostic approach to test prioritization, Technical Report TUD-SERG-2010-007, Software Engineering Research Group, Delft University of Technology, Delft, the Netherlands, 2010.
-
(2010)
A Diagnostic Approach to Test Prioritization, Technical Report TUD-SERG-2010-007
-
-
Gonzalez-Sanchez, R.1
Abreu, H.-G.2
Gross, A.3
Van Gemund4
-
21
-
-
77958162686
-
Prioritizing tests for software fault localization
-
IEEE Computer Society Press Los Alamitos, CA
-
A. Gonzalez-Sanchez, E. Piel, H.-G. Gross, and A.J.C. van Gemund Prioritizing tests for software fault localization Proceedings of the 10th International Conference on Quality Software (QSIC 2010) 2010 IEEE Computer Society Press Los Alamitos, CA 42 51
-
(2010)
Proceedings of the 10th International Conference on Quality Software (QSIC 2010)
, pp. 42-51
-
-
Gonzalez-Sanchez, A.1
Piel, E.2
Gross, H.-G.3
Van Gemund, A.J.C.4
-
23
-
-
77958196653
-
On the integration of test adequacy: Test case prioritization and statistical fault localization, the 1st International Workshop on Program Debugging in China (IWPDC 2010)
-
Los Alamitos, CA
-
B. Jiang, W.K. Chan, On the integration of test adequacy: test case prioritization and statistical fault localization, The 1st International Workshop on Program Debugging in China (IWPDC 2010), in: Proceedings of the 10th International Conference on Quality Software (QSIC 2010), IEEE Computer Society Press, Los Alamitos, CA, 2010, pp. 377-384.
-
(2010)
Proceedings of the 10th International Conference on Quality Software (QSIC 2010), IEEE Computer Society Press
, pp. 377-384
-
-
Jiang, B.1
Chan, W.K.2
-
24
-
-
77958163790
-
Regression testing process improvement for specification evolution of real-world protocol software
-
IEEE Computer Society Press Los Alamitos, CA
-
B. Jiang, T.H. Tse, W. Grieskamp, N. Kicillof, Y. Cao, and X. Li Regression testing process improvement for specification evolution of real-world protocol software Proceedings of the 10th International Conference on Quality Software (QSIC 2010) 2010 IEEE Computer Society Press Los Alamitos, CA 62 71
-
(2010)
Proceedings of the 10th International Conference on Quality Software (QSIC 2010)
, pp. 62-71
-
-
Jiang, B.1
Tse, T.H.2
Grieskamp, W.3
Kicillof, N.4
Cao, Y.5
Li, X.6
-
25
-
-
77952123669
-
Adaptive random test case prioritization
-
IEEE Computer Society Press Los Alamitos, CA
-
B. Jiang, Z. Zhang, W.K. Chan, and T.H. Tse Adaptive random test case prioritization Proceedings of the 24th IEEE/ACM International Conference on Automated Software Engineering (ASE 2009) 2009 IEEE Computer Society Press Los Alamitos, CA 233 244
-
(2009)
Proceedings of the 24th IEEE/ACM International Conference on Automated Software Engineering (ASE 2009)
, pp. 233-244
-
-
Jiang, B.1
Zhang, Z.2
Chan, W.K.3
Tse, T.H.4
-
26
-
-
70449637968
-
How well do test case prioritization techniques support statistical fault localization
-
IEEE Computer Society Press, Los Alamitos, CA
-
B. Jiang, Z. Zhang, T.H. Tse, T.Y. Chen, How well do test case prioritization techniques support statistical fault localization, in: Proceedings of the 33rd Annual International Computer Software and Applications Conference (COMPSAC 2009), vol. 1, IEEE Computer Society Press, Los Alamitos, CA, 2009, pp. 99-106.
-
(2009)
Proceedings of the 33rd Annual International Computer Software and Applications Conference (COMPSAC 2009)
, vol.1
, pp. 99-106
-
-
Jiang, B.1
Zhang, Z.2
Tse, T.H.3
Chen, T.Y.4
-
30
-
-
77958194524
-
A simulation study on some search algorithms for regression test case prioritization
-
IEEE Computer Society Press Los Alamitos, CA
-
S. Li, N. Bian, Z. Chen, D. You, and Y. He A simulation study on some search algorithms for regression test case prioritization Proceedings of the 10th International Conference on Quality Software (QSIC 2010) 2010 IEEE Computer Society Press Los Alamitos, CA 72 81
-
(2010)
Proceedings of the 10th International Conference on Quality Software (QSIC 2010)
, pp. 72-81
-
-
Li, S.1
Bian, N.2
Chen, Z.3
You, D.4
He, Y.5
-
31
-
-
34047189734
-
Search algorithms for regression test case prioritization
-
DOI 10.1109/TSE.2007.38
-
Z. Li, M. Harman, and R.M. Hierons Search algorithms for regression test case prioritization IEEE Transactions on Software Engineering 33 4 2007 225 237 (Pubitemid 46523213)
-
(2007)
IEEE Transactions on Software Engineering
, vol.33
, Issue.4
, pp. 225-237
-
-
Li, Z.1
Harman, M.2
Hierons, R.M.3
-
32
-
-
33745244751
-
Scalable statistical bug isolation
-
ACM Press New York, NY
-
B. Liblit, M. Naik, A.X. Zheng, A. Aiken, and M.I. Jordan Scalable statistical bug isolation Proceedings of the 2005 ACM SIGPLAN Conference on Programming Language Design and Implementation (PLDI 2005) 2005 ACM Press New York, NY 15 26
-
(2005)
Proceedings of the 2005 ACM SIGPLAN Conference on Programming Language Design and Implementation (PLDI 2005)
, pp. 15-26
-
-
Liblit, B.1
Naik, M.2
Zheng, A.X.3
Aiken, A.4
Jordan, M.I.5
-
33
-
-
0034350524
-
A proof of the triangle inequality for the Tanimoto distance
-
A.H. Lipkus A proof of the triangle inequality for the Tanimoto distance Journal of Mathematical Chemistry 26 1 1999 263 265
-
(1999)
Journal of Mathematical Chemistry
, vol.26
, Issue.1
, pp. 263-265
-
-
Lipkus, A.H.1
-
39
-
-
34247327814
-
TimeAware test suite prioritization
-
ACM Press New York, NY
-
K.R. Walcott, M.L. Soffa, G.M. Kapfhammer, and R.S. Roos TimeAware test suite prioritization Proceedings of the 2006 ACM SIGSOFT International Symposium on Software Testing and Analysis (ISSTA 2006) 2006 ACM Press New York, NY 1 12
-
(2006)
Proceedings of the 2006 ACM SIGSOFT International Symposium on Software Testing and Analysis (ISSTA 2006)
, pp. 1-12
-
-
Walcott, K.R.1
Soffa, M.L.2
Kapfhammer, G.M.3
Roos, R.S.4
-
40
-
-
73149083478
-
A family of code coverage-based heuristics for effective fault localization
-
W.E. Wong, V. Debroy, and B. Choi A family of code coverage-based heuristics for effective fault localization Journal of Systems and Software 83 2 2010 188 208
-
(2010)
Journal of Systems and Software
, vol.83
, Issue.2
, pp. 188-208
-
-
Wong, W.E.1
Debroy, V.2
Choi, B.3
-
41
-
-
0031335528
-
A study of effective regression testing in practice
-
IEEE Computer Society Press Los Alamitos, CA
-
W.E. Wong, J.R. Horgan, S. London, and H. Agrawal A study of effective regression testing in practice Proceedings of the 8th International Symposium on Software Reliability Engineering (ISSRE 1997) 1997 IEEE Computer Society Press Los Alamitos, CA 264 274
-
(1997)
Proceedings of the 8th International Symposium on Software Reliability Engineering (ISSRE 1997)
, pp. 264-274
-
-
Wong, W.E.1
Horgan, J.R.2
London, S.3
Agrawal, H.4
-
42
-
-
77954504334
-
A dynamic test cluster sampling strategy by leveraging execution spectra information
-
IEEE Computer Society Press Los Alamitos, CA
-
S. Yan, Z. Chen, Z. Zhao, C. Zhang, and Y. Zhou A dynamic test cluster sampling strategy by leveraging execution spectra information Proceedings of the 3rd International Conference on Software Testing, Verification, and Validation (ICST 2010) 2010 IEEE Computer Society Press Los Alamitos, CA 147 154
-
(2010)
Proceedings of the 3rd International Conference on Software Testing, Verification, and Validation (ICST 2010)
, pp. 147-154
-
-
Yan, S.1
Chen, Z.2
Zhao, Z.3
Zhang, C.4
Zhou, Y.5
-
43
-
-
79959294916
-
An empirical study on the effectiveness of time-aware test case prioritization techniques
-
ACM Press New York, NY
-
I. You, Z. Chen, B. Xu, B. Luo, and C. Zhang An empirical study on the effectiveness of time-aware test case prioritization techniques Proceedings of the 2011 ACM Symposium on Applied Computing (SAC 2011) 2011 ACM Press New York, NY
-
(2011)
Proceedings of the 2011 ACM Symposium on Applied Computing (SAC 2011)
-
-
You, I.1
Chen, Z.2
Xu, B.3
Luo, B.4
Zhang, C.5
-
45
-
-
77958194994
-
An improved regression test selection technique by clustering execution profiles
-
IEEE Computer Society Press Los Alamitos, CA
-
C. Zhang, Z. Chen, Z. Zhao, S. Yan, J. Zhang, and B. Xu An improved regression test selection technique by clustering execution profiles Proceedings of the 10th International Conference on Quality Software (QSIC 2010) 2010 IEEE Computer Society Press Los Alamitos, CA 171 179
-
(2010)
Proceedings of the 10th International Conference on Quality Software (QSIC 2010)
, pp. 171-179
-
-
Zhang, C.1
Chen, Z.2
Zhao, Z.3
Yan, S.4
Zhang, J.5
Xu, B.6
-
46
-
-
85008264025
-
Time-aware test-case prioritization using integer linear programming
-
ACM Press New York, NY
-
L. Zhang, S.-S. Hou, C. Guo, T. Xie, and H. Mei Time-aware test-case prioritization using integer linear programming Proceedings of the 2009 ACM SIGSOFT International Symposium on Software Testing and Analysis (ISSTA 2009) 2009 ACM Press New York, NY 213 224
-
(2009)
Proceedings of the 2009 ACM SIGSOFT International Symposium on Software Testing and Analysis (ISSTA 2009)
, pp. 213-224
-
-
Zhang, L.1
Hou, S.-S.2
Guo, C.3
Xie, T.4
Mei, H.5
-
47
-
-
69749099373
-
Is non-parametric hypothesis testing model robust for statistical fault localization?
-
Z. Zhang, W.K. Chan, T.H. Tse, P. Hu, and X. Wang Is non-parametric hypothesis testing model robust for statistical fault localization? Information and Software Technology 51 11 2009 1573 1585
-
(2009)
Information and Software Technology
, vol.51
, Issue.11
, pp. 1573-1585
-
-
Zhang, Z.1
Chan, W.K.2
Tse, T.H.3
Hu, P.4
Wang, X.5
-
48
-
-
77949365707
-
Capturing propagation of infected program states
-
ACM Press New York, NY
-
Z. Zhang, W.K. Chan, T.H. Tse, B. Jiang, and X. Wang Capturing propagation of infected program states Proceedings of the 7th Joint Meeting of the European Software Engineering Conference and the ACM SIGSOFT International Symposium on Foundations of Software Engineering (ESEC 2009/FSE-17) 2009 ACM Press New York, NY 43 52
-
(2009)
Proceedings of the 7th Joint Meeting of the European Software Engineering Conference and the ACM SIGSOFT International Symposium on Foundations of Software Engineering (ESEC 2009/FSE-17)
, pp. 43-52
-
-
Zhang, Z.1
Chan, W.K.2
Tse, T.H.3
Jiang, B.4
Wang, X.5
-
49
-
-
79953688693
-
Non-parametric statistical fault localization
-
Z. Zhang, W.K. Chan, T.H. Tse, Y.T. Yu, and P. Hu Non-parametric statistical fault localization Journal of Systems and Software 84 6 2011 885 905
-
(2011)
Journal of Systems and Software
, vol.84
, Issue.6
, pp. 885-905
-
-
Zhang, Z.1
Chan, W.K.2
Tse, T.H.3
Yu, Y.T.4
Hu, P.5
-
50
-
-
73149118240
-
Fault localization through evaluation sequences
-
Z. Zhang, B. Jiang, W.K. Chan, T.H. Tse, and X. Wang Fault localization through evaluation sequences Journal of Systems and Software 83 2 2010 174 187
-
(2010)
Journal of Systems and Software
, vol.83
, Issue.2
, pp. 174-187
-
-
Zhang, Z.1
Jiang, B.2
Chan, W.K.3
Tse, T.H.4
Wang, X.5
-
51
-
-
78649832920
-
Using coverage information to guide test case selection in adaptive random testing, the 7th International Workshop on Software Cybernetics (IWSC 2010)
-
Los Alamitos, CA
-
Z.Q. Zhou, Using coverage information to guide test case selection in adaptive random testing, The 7th International Workshop on Software Cybernetics (IWSC 2010), in: Proceedings of the 34th Annual Computer Software and Applications Conference (COMPSAC 2010), IEEE Computer Society Press, Los Alamitos, CA, 2010, pp. 208-213.
-
(2010)
Proceedings of the 34th Annual Computer Software and Applications Conference (COMPSAC 2010), IEEE Computer Society Press
, pp. 208-213
-
-
Zhou, Z.Q.1
|