High-resolution Laue-type DuMond curved crystal spectrometer

Review of Scientific Instruments

Volumn 84, Issue 9, 2013, Pages

  Szlachetko, M ^a,b   Berset, M ^a   Dousse, J Cl ^a   Hoszowska, J ^a   Szlachetko, J ^b,c  

^a UNIVERSITY OF FRIBOURG   (Switzerland)

^b PAUL SCHERRER INSTITUTE   (Switzerland)

^c JAN KOCHANOWSKI UNIVERSITY   (Poland)

Author keywords

[No Author keywords available]

Indexed keywords

CURVED CRYSTAL SPECTROMETER; DIFFRACTION ORDERS; ENERGY DIFFERENCES; ENERGY RESOLUTIONS; EXTENDED X-RAY ABSORPTION FINE STRUCTURE MEASUREMENTS; INSTRUMENTAL RESOLUTION; NATURAL LINEWIDTHS; OPERATIONAL CHARACTERISTICS;

DIFFRACTION; EXTENDED X RAY ABSORPTION FINE STRUCTURE SPECTROSCOPY; X RAY SPECTROMETERS; X RAYS;

SPECTROMETERS;

EID: 84885161177     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.4821621     Document Type: Article

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