Design and performance of a curved-crystal x-ray emission spectrometer

Review of Scientific Instruments

Volumn 78, Issue 5, 2007, Pages

  Hudson, A C ^a   Stolte, W C ^a   Lindle, D W ^a   Guillemin, R ^b  

^a UNIVERSITY OF NEVADA   (United States)

^b SORBONNE UNIVERSITÉ   (France)

Author keywords

[No Author keywords available]

Indexed keywords

FLUORESCENCE; LIGHT EMISSION; LIGHT POLARIZATION; PHOTODETECTORS; ROTATION; VACUUM APPLICATIONS;

ENERGY RANGE; EXPERIMENTAL CHAMBERS; INCIDENT RADIATIONS; X-RAY EMISSION SPECTROMETERS;

X RAY SPECTROMETERS;

ARTICLE; EQUIPMENT; EQUIPMENT DESIGN; EVALUATION; INSTRUMENTATION; METHODOLOGY; REFRACTOMETRY; REPRODUCIBILITY; SENSITIVITY AND SPECIFICITY; SPECTROMETRY;

EQUIPMENT DESIGN; EQUIPMENT FAILURE ANALYSIS; REFRACTOMETRY; REPRODUCIBILITY OF RESULTS; SENSITIVITY AND SPECIFICITY; SPECTROMETRY, X-RAY EMISSION;

EID: 34249951359     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2735933     Document Type: Article

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