Metrological characterization of X-ray diffraction methods at different acquisition geometries for determination of crystallite size in nano-scale materials

Materials Characterization

Volumn 85, Issue , 2013, Pages 111-123

  Uvarov, Vladimir ^a   Popov, Inna ^a  

^a HEBREW UNIVERSITY OF JERUSALEM   (Israel)

Author keywords

Crystallite size determination; Parallel beam geometry; Rietveld procedure; Scherrer equation; Williamson Hall method; X ray diffraction

Indexed keywords

BRAGG-BRENTANO GEOMETRY; METROLOGICAL CHARACTERIZATION; NANO-SCALE MATERIALS; PARALLEL BEAM GEOMETRY; SCHERRER EQUATIONS; THE SCANNING ELECTRON MICROSCOPES (SEM); WILLIAMSON-HALL; X-RAY DIFFRACTION METHOD;

APPLICATION PROGRAMS; DATA PROCESSING; GEOMETRY; RIETVELD REFINEMENT; SCANNING ELECTRON MICROSCOPY; X RAY DIFFRACTION;

CRYSTALLITE SIZE;

EID: 84885103022     PISSN: 10445803     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.matchar.2013.09.002     Document Type: Article

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