Crystallite size determination of MgO nanopowder from X-ray diffraction patterns registered in GIXD technique

Solid State Phenomena

Volumn 163, Issue , 2010, Pages 177-182

  Goryczka, T ^a   Dercz, G ^a   Prusik, K ^a   Pajak L ^a   Lagiewka E ^a  

^a UNIVERSITY OF SILESIA   (Poland)

Author keywords

GIXD; MgO; Nanocrystalline material; Rietveld refinement; XRD

Indexed keywords

COMPUTATIONAL GEOMETRY; DIFFRACTION PATTERNS; GELS; HOLOGRAPHIC INTERFEROMETRY; MINERALOGY; NANOCRYSTALLINE ALLOYS; NANOSTRUCTURED MATERIALS; RIETVELD METHOD; RIETVELD REFINEMENT; SIZE DETERMINATION; X RAY CRYSTALLOGRAPHY; X RAY DIFFRACTION; X RAY MICROSCOPES; X RAYS; CHROMIUM COMPOUNDS; GEOMETRY; INTERFEROMETRY; MAGNESIA; NANOCRYSTALLINE MATERIALS; NANOCRYSTALS; SOL-GELS;

BRAGG-BRENTANO GEOMETRY; DIFFRACTION LINES; GIXD; LATTICE DISTORTIONS; LINE BROADENING; NANO POWDERS; NANO-MATERIALS; NANOCRYSTALLINE LAYERS; NANOCRYSTALLINE MGO; SOL-GEL SYNTHESIS; WILLIAMSON-HALL; X-RAY DIFFRACTION DATA; XRD; NANO-CRYSTALLINE LAYERS; SOL - GEL SYNTHESIS;

CRYSTALLITE SIZE;

EID: 77955452461     PISSN: 10120394     EISSN: None     Source Type: Book Series    
DOI: 10.4028/www.scientific.net/SSP.163.177     Document Type: Conference Paper

References (16)

1. E. Bontempi, P. Colombi, L.E. Depero, L. Cartechini, F. Presciutti, B.G. Brunetti, A. Sgamellotti: Appl. Phys. A 83 (2006), p. 543-546
2. G. Brezesinski, F. Bringezu, G. Weidemann: Thin Solid Films 327-329 (1998), p. 256-261
3. S.A.W. Verclas, P.B. Howes, K. Kjaer, A. Wurlitzer, M. Weygand, G. Buldt, N.A. Dencher, M. Losche: J. Mol. Biol. 287 (1999), p. 837-843
4. H. Fujisawa, M. Okaniwa, H. Nonomura, M. Shimizu, H. Niu: J. Europ. Ceram. Soc. 24 (2004), p. 1641-1645
5. T. Goryczka, G. Dercz, L. Paja̧k, E. Ła̧giewka: Solid State Phen. 130 (2007), p. 281-283
6. J. Titus, H.W. Schock, R. W. Birkmire, W.N. Shafarman, U.P. Singh: MRS Spring Meeting Proceedings Volume668 (2001) H1.5
7. S. Li, Ch. Potter, D. Palmer, D.D. Eberl, T. Klemmer, J. Spear, C. Reiss, D. Brown, A. Morrone: Trans. Magnet. 37 (2001), p. 1947-1949
8. E. Lucas, S. Decker, A. Khaleel, A. Seitz, S. Fultz, A. Ponce, W. Li, C. Carnes, K.J. Klabunde: Chem. Eur. J. 7 (2001), p. 2505-2510
9. V.R. Choudhary, V.H. Rane and R.V. Gadre: J. Catal. 145 (1994), p. 300-311
10. R.M. Morris, K.J. Klabunde: Inorg. Chem. 22 (1983), p. 682-687
11. S. Utamapanya, K.J. Klabunde, J.R. Schlup: Chem. Mater. 3 (1991), p. 175
12. Y. Zeng, T. Lu, P. Zou, S. Zhu, L. Wang, L. Shen: Mat. Res. Soc. Symp. Proc. 792 (2004) R9.15.1
13. H.M. Rietveld: J. of Appl. Cryst. 2 (1969), p. 65-71
14. Card No 4-0829, Powder Diffraction Files PDF-2, International Center for Diffraction Data
15. G.K. Williamson and W.H. Hall: Acta Metall. Vol.1 (1953), p. 22-31
16. B.D. Cullity: Elements of X-ray diffraction, 2nd Addison-Wesley, Massachusetts 1978