Multi foci with diffraction limited resolution

Optics Express

Volumn 21, Issue 18, 2013, Pages 21708-21713

  Waller, Erik H ^a   Von Freymann, Georg ^a,b  

^a University of Koblenz Landau   (Germany)

^b FRAUNHOFER INSTITUTE FOR PHYSICAL MEASUREMENT TECHNIQUES IPM   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ALGORITHMS;

DIFFRACTION-LIMITED RESOLUTION; DIRECT LASER WRITING; FUNCTION MEASUREMENTS; HIGH NUMERICAL APERTURE OBJECTIVE; INTERFERENCE EFFECTS; MODIFIED ALGORITHMS; SCANNING MICROSCOPY; STANDARD ALGORITHMS;

DIFFRACTION;

EID: 84884541205     PISSN: None     EISSN: 10944087     Source Type: Journal    
DOI: 10.1364/OE.21.021708     Document Type: Article

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