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Physical Review B - Condensed Matter and Materials Physics

Volumn 88, Issue 7, 2013, Pages

Thickness-dependent bulk electronic properties in Bi2Se 3 thin films revealed by infrared spectroscopy

(6) Post, K W a Chapler, B C a He, Liang b Kou, Xufeng b Wang, Kang L b Basov, D N a

a UNIVERSITY OF CALIFORNIA (United States)

b UNIVERSITY OF CALIFORNIA (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 84884368094 PISSN: 10980121 EISSN: 1550235X Source Type: Journal
DOI: 10.1103/PhysRevB.88.075121 Document Type: Article

Times cited : (58)

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