Review of terahertz technology readiness assessment and applications

Journal of Infrared, Millimeter, and Terahertz Waves

Volumn 34, Issue 9, 2013, Pages 500-518

  Redo Sanchez, Albert ^a   Laman, Norman ^a   Schulkin, Brian ^a   Tongue, Thomas ^a  

^a ZOMEGA TERAHERTZ CORPORATION   (United States)

Author keywords

imaging; non destructive evaluation; spectroscopy; systems; technology readiness; terahertz

Indexed keywords

APPLICATION REQUIREMENTS; LABORATORY ENVIRONMENT; MANUFACTURING INDUSTRIES; NON DESTRUCTIVE EVALUATION; SPECTROSCOPIC CHARACTERIZATION; TECHNOLOGY READINESS; TECHNOLOGY READINESS LEVELS; TERA HERTZ;

APPROXIMATION THEORY; COMPUTER SYSTEMS; IMAGING TECHNIQUES; NONDESTRUCTIVE EXAMINATION; PRODUCTION CONTROL; SPECTROSCOPY; TECHNOLOGY;

TERAHERTZ SPECTROSCOPY;

EID: 84884349557     PISSN: 18666892     EISSN: 18666906     Source Type: Journal    
DOI: 10.1007/s10762-013-9998-y     Document Type: Review

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