Surface mapping of carrier density in a GaN wafer using a frequency-agile THz source

Journal of the European Optical Society

Volumn 4, Issue , 2009, Pages

  Ohno, Seigo ^a   Hamano, Akihide ^b   Miyamoto, Katsuhiko ^a   Suzuki, Chisato ^b   Ito, Hiromasa ^a,c  

^a RIKEN   (Japan)

^b FURUKAWA CO LTD   (Japan)

^c TOHOKU UNIVERSITY   (Japan)

Author keywords

Carrier density; GaN; Imaging systems; Terahertz spectroscopy

Indexed keywords

EID: 68949191211     PISSN: None     EISSN: 19902573     Source Type: Journal    
DOI: 10.2971/jeos.2009.09012     Document Type: Article

References (9)

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