Re-anodizing technique as a method of investigation of thermally activated defects in anodic alumina films

Journal of the Electrochemical Society

Volumn 160, Issue 6, 2013, Pages

  Vrublevsky, Igor A ^a   Jagminas, Arunas I ^b   Chernyakovaa, Katsiaryna V ^a  

^a BELARUSIAN STATE UNIVERSITY OF INFORMATICS AND RADIOELECTRONICS   (Belarus)

^b CENTER FOR PHYSICAL SCIENCES AND TECHNOLOGY   (Lithuania)

Author keywords

[No Author keywords available]

Indexed keywords

ANODIC ALUMINA FILM; CO-ORDINATIVELY UNSATURATED; ELECTRON TRAP LEVELS; ENERGY OF ELECTRON; FTIR SPECTROSCOPY; OXALIC ACID ALUMINA FILMS; SOFT-X-RAY ABSORPTION; THERMALLY ACTIVATED;

ACTIVATION ENERGY; ALUMINA; ALUMINUM SHEET; FOURIER TRANSFORM INFRARED SPECTROSCOPY; PHOTOELECTRON SPECTROSCOPY;

ELECTRON TRAPS;

EID: 84884307630     PISSN: 00134651     EISSN: 19457111     Source Type: Journal    
DOI: 10.1149/2.124306jes     Document Type: Article

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