Formation and disruption of current paths of anodic porous alumina films by conducting atomic force microscopy

Applied Surface Science

Volumn 257, Issue 3, 2010, Pages 837-841

  Oyoshi, K ^a   Nigo, S ^a   Inoue, J ^a   Sakai, O ^a   Kitazawa, H ^a   Kido, G ^a  

^a NATIONAL INSTITUTE FOR MATERIALS SCIENCE   (Japan)

Author keywords

Anodic porous alumina; Conducting atomic force microscope; Current path; Resistive RAM; Scanning probe microscope

Indexed keywords

ALUMINA; ALUMINUM OXIDE; ATOMIC FORCE MICROSCOPY; HONEYCOMB STRUCTURES; RRAM; SCANNING PROBE MICROSCOPY; SWITCHING;

ALUMINA STRUCTURE; ANODIC POROUS ALUMINA; CONDUCTING ATOMIC FORCE MICROSCOPY; CURRENT PATHS; HONEYCOMB CELL STRUCTURES; POLAR SWITCHING; SWITCHING EFFECT; SWITCHING OPERATIONS;

CONDUCTIVE FILMS;

EID: 77956619671     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.apsusc.2010.07.076     Document Type: Article

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