Direct measurement of the thickness-dependent electronic band structure of MoS2 using angle-resolved photoemission spectroscopy

Physical Review Letters

Volumn 111, Issue 10, 2013, Pages

  Jin, Wencan ^a   Yeh, Po Chun ^a   Zaki, Nader ^a   Zhang, Datong ^a   Sadowski, Jerzy T ^b   Al Mahboob, Abdullah ^b   Van Der Zande, Arend M ^a,c   Chenet, Daniel A ^a   Dadap, Jerry I ^a   Herman, Irving P ^a   Sutter, Peter ^b   Hone, James ^a   Osgood, Richard M ^a  

^a Columbia University ^*  (United States)

^b BROOKHAVEN NATIONAL LABORATORY   (United States)

^c Och Spine at New York Presbyterian Hospitals   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ANGLE RESOLVED PHOTOEMISSION SPECTROSCOPY; BRILLOUIN ZONES; DIRECT MEASUREMENT; ELECTRONIC BAND STRUCTURE; HOLE EFFECTIVE MASS; MICROMETER-SCALE; MOLYBDENUM DISULFIDE; VALENCE-BAND MAXIMUMS;

BAND STRUCTURE; ELECTRONIC STRUCTURE; MONOLAYERS; PHOTOELECTRON SPECTROSCOPY; VAPORS;

MOLYBDENUM COMPOUNDS;

EID: 84884277879     PISSN: 00319007     EISSN: 10797114     Source Type: Journal    
DOI: 10.1103/PhysRevLett.111.106801     Document Type: Article

References (32)

1. J. Wilson and A. Yoffe, Adv. Phys. 18, 193 (1969). ADPHAH 0001-8732 10.1080/00018736900101307
2. K. S. Novoselov, Proc. Natl. Acad. Sci. U.S.A. 102, 10451 (2005). PNASA6 0027-8424 10.1073/pnas.0502848102
3. T. Böker, R. Severin, A. Müller, C. Janowitz, R. Manzke, D. Voß, P. Krüger, A. Mazur, and J. Pollmann, Phys. Rev. B 64, 235305 (2001). PRBMDO 0163-1829 10.1103/PhysRevB.64.235305
4. L. Mattheiss, Phys. Rev. B 8, 3719 (1973). PRBMDO 0163-1829 10.1103/PhysRevB.8.3719
5. R. Bromley, R. Murray, and A. Yoffe, J. Phys. C 5, 759 (1972). JPSOAW 0022-3719 10.1088/0022-3719/5/7/007
6. A. Splendiani, L. Sun, Y. Zhang, T. Li, J. Kim, C.-Y. Chim, G. Galli, and F. Wang, Nano Lett. 10, 1271 (2010). NALEFD 1530-6984 10.1021/nl903868w
7. Z. Y. Zhu, Y. C. Cheng, and U. Schwingenschlögl, Phys. Rev. B 84, 153402 (2011). PRBMDO 1098-0121 10.1103/PhysRevB.84.153402
8. D. Xiao, G. B. Liu, W. Feng, X. Xu, and W. Yao, Phys. Rev. Lett. 108, 196802 (2012). PRLTAO 0031-9007 10.1103/PhysRevLett.108.196802
9. B. Radisavljevic, A. Radenovic, J. Brivio, V. Giacometti, and A. Kis, Nat. Nanotechnol. 6, 147 (2011). NNAABX 1748-3387 10.1038/nnano.2010.279
10. W. S. Yun, S. W. Han, S. C. Hong, I. G. Kim, and J. D. Lee, Phys. Rev. B 85, 033305 (2012). PRBMDO 1098-0121 10.1103/PhysRevB.85.033305
11. K. F. Mak, C. Lee, J. Hone, J. Shan, and T. F. Heinz, Phys. Rev. Lett. 105, 136805 (2010). PRLTAO 0031-9007 10.1103/PhysRevLett.105.136805
12. K. F. Mak, K. He, J. Shan, and T. F. Heinz, Nat. Nanotechnol. 7, 494 (2012). NNAABX 1748-3387 10.1038/nnano.2012.96
13. C. Lee, H. Yan, L. E. Brus, T. F. Heinz, J. Hone, and S. Ryu, ACS Nano 4, 2695 (2010). ANCAC3 1936-0851 10.1021/nn1003937
14. R. Coehoorn, C. Haas, J. Dijkstra, C. Flipse, R. de Groot, and A. Wold, Phys. Rev. B 35, 6195 (1987). PRBMDO 0163-1829 10.1103/PhysRevB.35.6195
15. S. W. Han, Phys. Rev. B 86, 115105 (2012). PRBMDO 1098-0121 10.1103/PhysRevB.86.115105
16. S. K. Mahatha and K. S. Menon, J. Phys. Condens. Matter 24, 305502 (2012). JCOMEL 0953-8984 10.1088/0953-8984/24/30/305502
17. J. I. Flege, E. Vescovo, G. Nintzel, L. H. Lewis, S. Hulbert, and P. Sutter, Nucl. Instrum. Methods Phys. Res., Sect. B 261, 855 (2007). NIMBEU 0168-583X 10.1016/j.nimb.2007.04.095
18. P. Sutter, M. S. Hybertsen, J. T. Sadowski, and E. Sutter, Nano Lett. 9, 2654 (2009). NALEFD 1530-6984 10.1021/nl901040v
19. See Supplemental Material at http://link.aps.org/supplemental/10.1103/ PhysRevLett.111.106801 for details about sample preparation, ARPES configuration, and matrix-element analysis.
20. P. Sutter and E. Sutter, Adv. Funct. Mater. 23, 2617 (2013). AFMDC6 1616-3028 10.1002/adfm.201203426
21. J. J. Yeh and I. Lindau, At. Data Nucl. Data Tables 32, 1 (1985). ADNDAT 0092-640X 10.1016/0092-640X(85)90016-6
22. A. Kuc, N. Zibouche, and T. Heine, Phys. Rev. B 83, 245213 (2011). PRBMDO 1098-0121 10.1103/PhysRevB.83.245213
23. R. S. Sundaram, M. Engel, A. Lombardo, R. Krupke, A. C. Ferrari, Ph. Avouris, and M. Steiner, Nano Lett. 13, 1416 (2013). NALEFD 1530-6984 10.1021/nl400516a
24. Z. Yin, H. Li, H. Li, L. Jiang, Y. Shi, Y. Sun, G. Lu, Q. Zhang, X. Chen, and H. Zhang, ACS Nano 6, 74 (2012). ANCAC3 1936-0851 10.1021/nn2024557
25. E. Cappelluti, R. Roldán, J. A. Silva-Guillén, P. Ordejón, and F. Guinea, Phys. Rev. B 88, 075409 (2013). PRBMDO 1098-0121 10.1103/PhysRevB.88.075409
26. P. Zhang, P. Richard, T. Qian, Y.-M. Xu, X. Dai, and H. Ding, Rev. Sci. Instrum. 82, 043712 (2011). RSINAK 0034-6748 10.1063/1.3585113
27. H. Peelaers and C. G. Van de Walle, Phys. Rev. B 86, 241401 (2012). PRBMDO 1098-0121 10.1103/PhysRevB.86.241401
28. A. Ayari, E. Cobas, O. Ogundadegbe, and M. S. Fuhrer, J. Appl. Phys. 101, 014507 (2007). JAPIAU 0021-8979 10.1063/1.2407388
29. R. Fivaz and E. Mooser, Phys. Rev. 163, 743 (1967). PHRVAO 0031-899X 10.1103/PhysRev.163.743
30. A. M. van der Zande, P. Y. Huang, D. A. Chenet, T. C. Berkelbach, Y. You, G.-H. Lee, T. F. Heinz, D. R. Reichman, D. A. Muller, and J. C. Hone, Nat. Mater. 12, 554 (2013). NMAACR 1476-1122 10.1038/nmat3633
31. X. Gonze, Z. Kristallogr. 220, 558 (2005). ZEKRDZ 0044-2968 10.1524/zkri.220.5.558.65066
32. X. Gonze, Comput. Phys. Commun. 180, 2582 (2009). CPHCBZ 0010-4655 10.1016/j.cpc.2009.07.007