Scanning angle Raman spectroscopy of poly(3-hexylthiophene)-based films on indium tin oxide, gold, and sapphire surfaces

ACS Applied Materials and Interfaces

Volumn 5, Issue 17, 2013, Pages 8686-8693

  Meyer, Matthew W ^a,b   Larson, Kelsey L ^a   Mahadevapuram, Rakesh C ^c   Lesoine, Michael D ^a,b   Carr, John A ^c   Chaudhary, Sumit ^c   Smith, Emily A ^a,b  

^a U S DEPARTMENT OF ENERGY   (United States)

^b IOWA STATE UNIVERSITY   (United States)

^c Iowa State University of Science and Technology   (United States)

Author keywords

conjugated polymer films; P3HT; PCBM; phenyl C61 butyric acid methyl ester; Raman spectroscopy; thin film characterization

Indexed keywords

CHEMICAL COMPOSITIONS; CONTROLLED MORPHOLOGY; METHYL ESTERS; ORGANIC PHOTOVOLTAIC DEVICES; P3HT; PCBM; SPECTROSCOPIC MEASUREMENTS; THIN-FILM CHARACTERIZATION;

BLENDING; BUTYRIC ACID; CARRIER MOBILITY; CONJUGATED POLYMERS; ELECTRIC FIELDS; ESTERIFICATION; ESTERS; GOLD; LASER EXCITATION; MORPHOLOGY; POLYMER FILMS; RAMAN SCATTERING; SAPPHIRE; SUBSTRATES; TIN;

RAMAN SPECTROSCOPY;

EID: 84884245904     PISSN: 19448244     EISSN: 19448252     Source Type: Journal    
DOI: 10.1021/am4023225     Document Type: Article

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