Heat capacity, thermal conductivity, and interface resistance extraction for single-walled carbon nanotube films using frequency-domain thermoreflectance

IEEE Transactions on Components, Packaging and Manufacturing Technology

Volumn 3, Issue 9, 2013, Pages 1524-1532

  Gao, Yuan ^a   Marconnet, Amy M ^a   Xiang, Rong ^b   Maruyama, Shigeo ^c   Goodson, Kenneth E ^a  

^a Stanford University   (United States)

^b SUN YAT SEN UNIVERSITY   (China)

^c UNIVERSITY OF TOKYO   (Japan)

Author keywords

Carbon nanotubes (CNTs); Nanotechnology; Thermal management; Thermoreflectance; Thin films

Indexed keywords

COMPREHENSIVE ANALYSIS; PERFORMANCE AND RELIABILITIES; SCANNING ELECTRON MICROGRAPHS; THERMAL INTERFACE MATERIALS; THERMOREFLECTANCE; THERMOREFLECTANCE MEASUREMENT; THROUGH-PLANE THERMAL CONDUCTIVITIES; VERTICALLY ALIGNED CARBON NANOTUBE;

ATOMIC FORCE MICROSCOPY; CARBON NANOTUBES; CHEMICAL VAPOR DEPOSITION; FREQUENCY DOMAIN ANALYSIS; NANOTECHNOLOGY; SCANNING ELECTRON MICROSCOPY; SILVER; SINGLE-WALLED CARBON NANOTUBES (SWCN); SPECIFIC HEAT; SUBSTRATES; TEMPERATURE CONTROL; THERMAL CONDUCTIVITY OF SOLIDS; THERMAL INSULATING MATERIALS; THIN FILMS;

INTERFACES (MATERIALS);

EID: 84884218608     PISSN: 21563950     EISSN: None     Source Type: Journal    
DOI: 10.1109/TCPMT.2013.2254175     Document Type: Article

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