Measuring thermal and thermoelectric properties of one-dimensional nanostructures using a microfabricated device

Journal of Heat Transfer

Volumn 125, Issue 5, 2003, Pages 881-888

  Shi, Li ^a   Li, Deyu ^b   Yu, Choongho ^a   Jang, Wanyoung ^b   Kim, Dohyung ^a   Yao, Zhen ^b   Kim, Philip ^c   Majumdar, Arunava ^d  

^a The University of Texas at Austin   (United States)

^b UNIVERSITY OF CALIFORNIA   (United States)

^c Columbia University ^*  (United States)

^d LAWRENCE BERKELEY NATIONAL LABORATORY   (United States)

Author keywords

Heat transfer; Measurement techniques; Microscale; Nanoscale; Thermoelectric

Indexed keywords

CRYOSTATS; HEAT CONDUCTION; HEAT RESISTANCE; SILICON NITRIDE; THERMOMETERS;

MICROFABRICATED DEVICES;

CARBON NANOTUBES;

HEAT CONDUCTION; HEAT TRANSFER; MEASUREMENT ERROR; MEASUREMENT METHOD; NANOSTRUCTURE; THERMOMETER;

EID: 0242349591     PISSN: 00221481     EISSN: None     Source Type: Journal    
DOI: 10.1115/1.1597619     Document Type: Article

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