Photoconductive probing and computer simulation of microwave potentials inside a SiGe MMIC

1998 Topical Meeting on Silicon Monolithic Integrated Circuits in RF Systems, SiRF 1998

Volumn 1998-September, Issue , 1998, Pages 187-191

  David, G ^a   Yang, K ^a   Crites, M ^a   Rieh, J S ^a   Lu, L H ^a   Bhattacharya, P ^a   Katehi, L P B ^a   Whitaker, J F ^a  

^a UNIVERSITY OF MICHIGAN   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER AIDED DESIGN; MONOLITHIC INTEGRATED CIRCUITS; MONOLITHIC MICROWAVE INTEGRATED CIRCUITS; PHOTOCONDUCTIVITY; SENSITIVITY ANALYSIS;

ELECTRICAL POTENTIAL; FAULT ISOLATION; MEASUREMENT TECHNIQUES; MICRO-MACHINED; MICROWAVE CADS; MICROWAVE PERFORMANCE; PROCESS VARIATION; SAMPLING PROBES;

SI-GE ALLOYS;

EID: 84884210404     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/SMIC.1998.750219     Document Type: Conference Paper

References (14)

1. J. Valdmanis and G. Mourou, "Subpicosecond electrooptic sampling: Principles and applications," IEEE Quantum Electron., vol. QE-22, pp. 69-78, Jan. 1986.
2. M.J.W. Rodwell, M. Riaziat, K.J. Weingarten, B.A. Auld, and D.M. Bloom, "Internal microwave propagation and distortion characteristics of a traveling-wave amplifier studied by electrooptic sampling," IEEE Trans, on Microwave Theory Tech., vol. MTT-34, pp. 1356-1362, Dec. 1986.
3. G. David, R. Tempel, I. Wolf and D. Jager (1996), "Analysis of microwave propagation effects using 2D electro-optic field mapping techniques," Opt. Quantum Electron., vol. 28, pp. 919-931, July 1996.
4. D.E. Cooper, and S.C. Moss, "Picosecond optoelectronic measurement of the high frequency scattering parameters of a GaAs FET," IEEE J. Quantum Electron., vol. 22, pp. 94-100, Jan. 1986.
5. H.L.A. Hung, P. Polak-Dingels, K.J. Webb, T. Smith, H.C. Huang, and C.H. Lee, "Millimeter-wave monolithic integrated circuit characterization by a picosecond optoelectronic technique," IEEE Trans, on Microwave Theory Tech., vol. 37, pp. 1223-1231, Aug. 1989.
6. J. Kim, S. Williamson, J. Nees, S. Wakana, and J. F. Whitaker, "Photoconductive sampling probe with 2.3 ps temporal resolution and 4 HV sensitivity," Appl. Phys. Lett., vol. 62, pp. 2268-2270, May 1993.
7. T. Pfeifer, H.-M. Heiliger, E. Stein von Kaminski, H.G. Roskos, and H. Kurz, "Fabrication and characterization of freely positionable silicon-on-sapphire photoconductive probes," J. Opt. Soc. Am. B, vol. 11, pp. 2547-52, Dec. 1994.
8. J.-R. Hwang, H.-J. Cheng, J.F. Whitaker, and J.V. Rudd, "Photoconductive sampling with an integrated source follower/amplifier," Appl. Phys. Lett., vol. 68, pp. 1464-1466, Aug. 1996.
9. R.K. Lai, J.-R. Hwang, J. Nees, T.B. Norris, and J.F. Whitaker, "A fiber-mounted, micromachined photoconductive probe with 15nV/Hz-sensitivity," Appl. Phys. Lett., vol. 69, pp. 1843-1845, Sept. 1996.
10. K. Takeuchi, A. Mizuhara, "Potential image observation with ultrahigh space-time resolution," in Ultra&st Electronics and Optoelectronics, Technical Digest, (Optical Society of America, Washington, D.C., 1997), pp. 151-153.
11. [II] G. David, J. Whitaker, E. Ledbetter, T. Weatherford, D. Fouts, W. Goyette, K. Jobe, and K. Elliott, "A picosecond-response photoconductive-sampling probe for digital circuit testing," IEEE LEOS '97 Conference Digest, San Francisco, USA, pp. 236-237, Nov. 1997
12. G. David, J.F. Whitaker, T.R. Weatherford, K. Jobe, S. Meyer, M. Bustamante, W. Goyette , S. Thomas HI, and K. Elliott, "DC-to-mm-Wave Absolute Potential Measurements Inside Digital Microwave Ics Using a Micromachined Photoconductive Sampling Probe," 1998 IEEE MTT International Microwave Symp. Digest.
13. G. David, J. F. Whitaker, unpublished
14. J.-S. Rieh, L.-H. Lu, L. P. B. Katehi, P. Bhattacharya, E. T. Croke, G. E. Ponchak, and S. A. Alterovitz, "X-and Ku-Band Amplifiers Based on Si/SiGe HBT's and Micromachined Lumped Components," IEEE Trans, on Microwave Theory and Tech., Vol. 46, pp. 685-694, May 1998.