Point process statistics in atom probe tomography

Ultramicroscopy

Volumn 132, Issue , 2013, Pages 114-120

  Philippe, T ^a   Duguay, S ^b   Grancher, G ^b   Blavette, D ^b  

^a Northwestern University   (United States)

^b UNIVERSITÉ DE ROUEN   (France)

Author keywords

Atom probe tomography; Clustering; Delaunay tessellation; Nearest neighbour; Pair correlation function; Spatial point process

Indexed keywords

ATOM PROBE TOMOGRAPHY; CLUSTERING; DELAUNAY TESSELLATIONS; NEAREST NEIGHBOUR; PAIR CORRELATION FUNCTIONS; SPATIAL POINT PROCESS;

MICROELECTRONICS;

STATISTICAL MECHANICS;

ARTICLE; ATOM PROBE TOMOGRAPHY; CLUSTER ANALYSIS; CORRELATION ANALYSIS; K NEAREST NEIGHBOR; POISSON DISTRIBUTION; POPULATION DISTRIBUTION; PROBABILITY; PROCESS OPTIMIZATION; STATISTICAL ANALYSIS; TOMOGRAPHY;

EID: 84883828390     PISSN: 03043991     EISSN: 18792723     Source Type: Journal    
DOI: 10.1016/j.ultramic.2012.10.004     Document Type: Article

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