Quantification of double-layer Ni/YSZ fuel cell anodes from focused ion beam tomography data

Journal of Power Sources

Volumn 246, Issue , 2014, Pages 819-830

  Joos, Jochen ^a   Ender, Moses ^a   Rotscholl, Ingo ^a   Menzler, Norbert H ^b   Ivers Tiffée, Ellen ^a  

^a KARLSRUHE INSTITUTE OF TECHNOLOGY   (Germany)

^b FORSCHUNGSZENTRUM JÜLICH   (Germany)

Author keywords

Focused ion beam (FIB); Microstructure reconstruction; Ni YSZ anode; Segmentation algorithm; SOFC; Voxel

Indexed keywords

ELECTROCHEMICAL PERFORMANCE; FOCUSED ION BEAM TOMOGRAPHIES; MICRO-STRUCTURE PARAMETERS; MICROSTRUCTURE RECONSTRUCTION; RECONSTRUCTION PROCEDURE; SEGMENTATION ALGORITHMS; THREE-DIMENSIONAL MICROSTRUCTURES; VOXEL;

ANODES; FOCUSED ION BEAMS; MICROSTRUCTURE; NICKEL; SCANNING ELECTRON MICROSCOPY; SOLID OXIDE FUEL CELLS (SOFC); TOMOGRAPHY; YTTRIA STABILIZED ZIRCONIA; ZIRCONIA;

IMAGE SEGMENTATION;

EID: 84883797049     PISSN: 03787753     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jpowsour.2013.08.021     Document Type: Article

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