A framework for automatic segmentation in three dimensions of microstructural tomography data

Ultramicroscopy

Volumn 110, Issue 3, 2010, Pages 216-228

  Jorgensen P S ^a   Hansen, K V ^a   Larsen, R ^a   Bowen, J R ^a  

^a TECHNICAL UNIVERSITY OF DENMARK   (Denmark)

Author keywords

Automatic; Focused ion beam; Image analysis; Level set; Segmentation

Indexed keywords

3D SURFACE; AUTOMATIC; AUTOMATIC SEGMENTATIONS; CELL MATERIALS; COMPLEX MICROSTRUCTURES; DRIVING FORCES; IMAGE SLICES; LEVEL SET METHOD; LEVEL SET SEGMENTATION; MATERIAL MICROSTRUCTURES; MICRO-STRUCTURAL; NUMERICAL APPROXIMATIONS; SERIAL SECTIONING; SMOOTH SURFACE; SOLID OXIDE; SURFACE CURVATURES; THREE DIMENSIONS; THREE-DIMENSIONAL ANALYSIS; TIME-CONSUMING TASKS; VECTOR FIELDS;

DIFFERENTIAL EQUATIONS; FOCUSED ION BEAMS; IMAGE ANALYSIS; IONS; LEVEL MEASUREMENT; MICROSTRUCTURE; SURFACES; TOMOGRAPHY;

THREE DIMENSIONAL;

CERIUM OXIDE; GADOLINIUM; LANTHANUM; OXIDE; STRONTIUM;

ARTICLE; AUTOANALYSIS; CONTROLLED STUDY; FOCUSED ION BEAM TOMOGRAPHY; IMAGE ANALYSIS; IMAGE PROCESSING; MICRO-COMPUTED TOMOGRAPHY; POROSITY; QUANTITATIVE ANALYSIS; SCANNING ELECTRON MICROSCOPY; STRUCTURE ANALYSIS; SURFACE PROPERTY; TOMOGRAPHY;

EID: 75849161805     PISSN: 03043991     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.ultramic.2009.11.013     Document Type: Article

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