Three-dimensional numerical analysis of mixed ionic and electronic conducting cathode reconstructed by focused ion beam scanning electron microscope

Journal of Power Sources

Volumn 196, Issue 6, 2011, Pages 3073-3082

  Matsuzaki, Katsuhisa ^a   Shikazono, Naoki ^b   Kasagi, Nobuhide ^a  

^a UNIVERSITY OF TOKYO   (Japan)

^b INSTITUTE OF INDUSTRIAL SCIENCE   (Japan)

Author keywords

Cathode; Focused ion beam scanning electron microscopy; Lattice Boltzmann method; Mixed ionic and electronic conductor; Solid oxide fuel cell

Indexed keywords

ACTIVE AREA; CURRENT VECTORS; DUAL-BEAM; DUSTY GAS MODELS; EFFECTIVE TOOL; ELECTROCHEMICAL REACTIONS; ELECTRONIC CURRENT; ELECTRONIC TRANSPORT; FOCUSED ION BEAM SCANNING ELECTRON MICROSCOPY; GAS TRANSPORT; ION BEAM SCANNING; IONIC AND ELECTRONIC CONDUCTION; LATTICE BOLTZMANN METHOD; LOCAL EQUILIBRIUM; LOW OXYGEN PARTIAL PRESSURE; MIXED IONIC AND ELECTRONIC CONDUCTING; MIXED IONIC AND ELECTRONIC CONDUCTOR; NUMERICAL SIMULATION; OVERPOTENTIAL; OXYGEN POTENTIAL; SCANNING ELECTRON MICROSCOPE; SOLID OXIDE; STREAM LINES; THREE-DIMENSIONAL MICROSTRUCTURES;

BEAM PLASMA INTERACTIONS; DROP FORMATION; ELECTRON MICROSCOPES; ELECTRONS; FOCUSED ION BEAMS; ION BOMBARDMENT; IONS; METALLOGRAPHIC MICROSTRUCTURE; NUMERICAL ANALYSIS; OXYGEN; PHASE INTERFACES; SCANNING; SCANNING ELECTRON MICROSCOPY; SOLID OXIDE FUEL CELLS (SOFC);

THREE DIMENSIONAL;

EID: 78751626982     PISSN: 03787753     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jpowsour.2010.11.142     Document Type: Article

References (24)

1. S.C. Singhal, and K. Kendall High Temperature Solid Oxide Fuel Cells 2002 Elsevier
2. J. Mizusaki, Y. Mima, S. Yamauchi, K. Fueki, and H. Tagawa J. Solid State Chem. 80 1989 102 111
3. S.B. Adler Chem. Rev. 104 2004 4701 4843
4. J.R. Wilson, W. Kobsiriphat, R. Mendoza, H.-Y. Chen, J.M. Hiller, D.J. Miller, K. Thornton, P.W. Voorhees, S.B. Adler, and S. Barnett Nat. Mater. 5 2006 541 544
5. D. Gostovic, J.R. Smith, D.P. Kundinger, K.S. Jones, and E.D. Wachsman Electrochem. Solid-State Lett. 10 12 2007 B214 B217
6. P.R. Shearing, J. Golbert, R.J. Chater, and N.P. Brandon Chem. Eng. Sci. 64 2009 3928 3933
7. H. Iwai, N. Shikazono, T. Matsui, H. Teshima, M. Kishimoto, R. Kishida, D. Hayashi, K. Matsuzaki, D. Kanno, M. Saito, H. Muroyama, K. Eguchi, N. Kasagi, and H. Yoshida J. Power Sources 195 4 2010 955 961
8. J.R. Izzo Jr., A.S. Joshi, K.N. Grew, W.K.S. Chiu, A. Tkachuk, S.H. Wang, and W. Yun J. Electrochem. Soc. 155 5 2008 B504 B508
9. P.R. Shearing, J. Gelb, J. Yi, W.-K. Lee, M. Drakopolous, and N.P. Brandon Electrochem. Commun. 12 8 2010 1021 1024
10. A.S. Joshi, K.N. Grew, A.A. Peracchio, and W.K.S. Chiu J. Power Sources 164 2007 631 638
11. P. Asinari, M.C. Quaglia, M.R. von Spakovsky, and B.V. Kasula J. Power Sources 170 2007 359 375
12. Y. Suzue, N. Shikazono, and N. Kasagi J. Power Sources 184 2008 52 59
13. N. Shikazono, D. Kanno, K. Matsuzaki, H. Teshima, S. Sumino, and N. Kasagi J. Electrochem. Soc. 157 5 2010 B665 B672
14. P.R. Shearing, J. Gelb, J. Yi, W.-K. Lee, M. Drakopolous, and N.P. Brandon J. Power Sources 195 15 2010 4804 4810
15. J. Fleig Phys. Chem. Chem. Phys. 7 2005 2027 2037
16. W.E. Lorensen, and H.E. Cline Comput. Graphics 21 1987 163 169
17. J. Lindblad, and I. Nyström Lect. Note Comput. Sci. 2301 2002 61 71
18. R.T. DeHoff, and F.N. Rhines Quantitative Microscopy 1968 McGraw-Hill
19. R. Krishna, and J.A. Wesselingh Chem. Eng. Sci. 52 1997 861 911
20. V. Novák, P. Štěpánek, P. Kočí, M. Marek, and M. Kubíček Chem. Eng. Sci. 65 7 2010 2352 2360
21. H.J. Bouwmeester, M.W. Otter, and B.A. Boukamp J. Solid State Electrochem. 8 2004 599 605
22. J. Fleig, F.S. Baumann, and J. Maier ECS Proceedings, 2005-2007 2005 1636 1644
23. A. Esquirol, N.P. Brandon, J.A. Kilner, and M. Mogensen J. Electrochem. Soc. 151 2004 A1847 A1855
24. T.H. Zeiser, P. Lammers, E. Klemm, Y.W. Li, J. Bernsdorf, and G. Brenner Chem. Eng. Sci. 56 2001 1697