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Volumn 42, Issue 8, 2013, Pages 3209-3221

Mechanisms for charge trapping in single semiconductor nanocrystals probed by fluorescence blinking

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EID: 84883352824     PISSN: 03060012     EISSN: 14604744     Source Type: Journal    
DOI: 10.1039/c2cs35452g     Document Type: Article
Times cited : (135)

References (54)
  • 11
    • 33749541711 scopus 로고    scopus 로고
    • SPIE-The International Society for Optical Engineering, Bellingham, Washington, 2nd edn
    • M. Müller, Introduction to Confocal Fluorescence Microscopy, SPIE-The International Society for Optical Engineering, Bellingham, Washington, 2nd edn, 2006
    • (2006) Introduction to Confocal Fluorescence Microscopy
    • Müller, M.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.