-
2
-
-
47049095543
-
Development of a methodology for improving photovoltaic inverter reliability
-
Jul.
-
A. Ristow, M. Begovic, A. Pregelj, and A. Rohatgi, "Development of a methodology for improving photovoltaic inverter reliability," IEEE Trans. Ind. Electron., vol. 55, no. 7, pp. 2581-2592, Jul. 2008.
-
(2008)
IEEE Trans. Ind. Electron.
, vol.55
, Issue.7
, pp. 2581-2592
-
-
Ristow, A.1
Begovic, M.2
Pregelj, A.3
Rohatgi, A.4
-
3
-
-
33747608405
-
Intelligent PV module for grid-connected PV systems
-
Jun.
-
E. Roman, R. Alonso, P. Ibanez, S. Elorduizapatarietxe, and D. Goitia, "Intelligent PV module for grid-connected PV systems," IEEE Trans. Ind. Electron., vol. 53, no. 4, pp. 1066-1073, Jun. 2006.
-
(2006)
IEEE Trans. Ind. Electron.
, vol.53
, Issue.4
, pp. 1066-1073
-
-
Roman, E.1
Alonso, R.2
Ibanez, P.3
Elorduizapatarietxe, S.4
Goitia, D.5
-
4
-
-
0030109952
-
Tutorial: Temperature as an input to microelectronics-reliability models
-
PII S0018952996039802
-
P. Lall, "Tutorial: Temperature as an input to microelectronics - Reliability models," IEEE Trans. Reliability, vol. 45, no. 1, pp. 3-9, Mar. 1996. (Pubitemid 126771012)
-
(1996)
IEEE Transactions on Reliability
, vol.45
, Issue.1
, pp. 3-9
-
-
Lall, P.1
-
5
-
-
49149094645
-
Photovoltaic module reliability model based on field degradation studies
-
Aug.
-
M. Vazquez and I. Rey-Stolle, "Photovoltaic module reliability model based on field degradation studies," Prog. Photovoltaics: Res. Applicat., vol. 16, no. 5, pp. 419-433, Aug. 2008.
-
(2008)
Prog. Photovoltaics: Res. Applicat.
, vol.16
, Issue.5
, pp. 419-433
-
-
Vazquez, M.1
Rey-Stolle, I.2
-
6
-
-
84870608293
-
Ageing and failure modes of IGBT modules in high temperature power cycling
-
accepted for publication
-
V. Smet, F. Forest, and J. J. Huselstein, "Ageing and failure modes of IGBT modules in high temperature power cycling," IEEE Trans. Ind. Electron., accepted for publication.
-
IEEE Trans. Ind. Electron.
-
-
Smet, V.1
Forest, F.2
Huselstein, J.J.3
-
7
-
-
80053500744
-
Reliability consideration of low-power grid-tied inverter for photovoltaic application
-
J. Liu and N. Henze, "Reliability consideration of low-power grid-tied inverter for photovoltaic application," in Proc. 24th Eur. Photovoltaic Solar Energy Conference and Exhibition, Hamburg, Germany, Sep. 2009.
-
Proc. 24th Eur. Photovoltaic Solar Energy Conference and Exhibition, Hamburg, Germany, Sep. 2009
-
-
Liu, J.1
Henze, N.2
-
8
-
-
47049125539
-
Reliability issues in photovoltaic power processing systems
-
Jul.
-
G. Petrone, G. Spagnuolo, R. Teodorescu, M. Veerachary, and M. Vitelli, "Reliability issues in photovoltaic power processing systems," IEEE Trans. Ind. Electron., vol. 55, no. 7, pp. 2569-2580, Jul. 2008.
-
(2008)
IEEE Trans. Ind. Electron.
, vol.55
, Issue.7
, pp. 2569-2580
-
-
Petrone, G.1
Spagnuolo, G.2
Teodorescu, R.3
Veerachary, M.4
Vitelli, M.5
-
9
-
-
0020172570
-
A methodology for photovoltaic system reliability & economic analysis
-
Aug.
-
L. H. Stember, W. R. Huss, and M. S. Bridgman, "A methodology for photovoltaic system reliability & economic analysis," IEEE Trans. Reliability, vol. 31, no. 3, pp. 296-303, Aug. 1982.
-
(1982)
IEEE Trans. Reliability
, vol.31
, Issue.3
, pp. 296-303
-
-
Stember, L.H.1
Huss, W.R.2
Bridgman, M.S.3
-
10
-
-
77957976861
-
Integrating photovoltaic inverter reliability into energy yield estimation with Markov models
-
S. V. Dhople, A. Davoudi, P. L. Chapman, and A. D. Domínguez- García, "Integrating photovoltaic inverter reliability into energy yield estimation with Markov models," in Proc. 2010 IEEE 12th Workshop on Control and Modeling for Power Electronics (COMPEL), Boulder, CO, Jun. 2010, pp. 1-5.
-
Proc. 2010 IEEE 12th Workshop on Control and Modeling for Power Electronics (COMPEL), Boulder, CO, Jun. 2010
, pp. 1-5
-
-
Dhople, S.V.1
Davoudi, A.2
Chapman, P.L.3
Domínguez-García, A.D.4
-
11
-
-
77951565275
-
Reliability and availability analysis of a fielded photovoltaic system
-
E. Collins, M. Dvorack, J. Mahn, M. Mundt, and M. Quintana, "Reliability and availability analysis of a fielded photovoltaic system," in Proc. 34th IEEE Photovolt. Spec. Conf., 2009, pp. 316-2321.
-
Proc. 34th IEEE Photovolt. Spec. Conf., 2009
, pp. 316-2321
-
-
Collins, E.1
Dvorack, M.2
Mahn, J.3
Mundt, M.4
Quintana, M.5
-
12
-
-
0036953403
-
Impact of inverter configuration on PV system reliability and energy production
-
A. Pregelj, M. Begovic, and A. Rohatgi, "Impact of inverter configuration on PV system reliability and energy production," in Proc. 29th IEEE Photovolt. Spec. Conf., 2002, pp. 1388-1391.
-
Proc. 29th IEEE Photovolt. Spec. Conf., 2002
, pp. 1388-1391
-
-
Pregelj, A.1
Begovic, M.2
Rohatgi, A.3
-
13
-
-
1942436339
-
Assessing the reliability and degradation of photovoltaic module performance parameters
-
Mar.
-
E. L. Meyer and E. E. van Dyk, "Assessing the reliability and degradation of photovoltaic module performance parameters," IEEE Trans. Reliability, vol. 53, no. 1, pp. 83-92, Mar. 2004.
-
(2004)
IEEE Trans. Reliability
, vol.53
, Issue.1
, pp. 83-92
-
-
Meyer, E.L.1
Van Dyk, E.E.2
-
14
-
-
36349001632
-
Reliability prediction for inverters in hybrid electrical vehicles
-
DOI 10.1109/TPEL.2007.909236
-
D. Hirschmann, D. Tissen, S. Schröder, and R. W. De Doncker, "Reliability prediction for inverters in hybrid electrical vehicles," IEEE Trans. Power Electron., vol. 22, no. 6, pp. 2511-2517, Nov. 2007. (Pubitemid 350154084)
-
(2007)
IEEE Transactions on Power Electronics
, vol.22
, Issue.6
, pp. 2511-2517
-
-
Hirschmann, D.1
Tissen, D.2
Schroder, S.3
De Doncker, R.W.4
-
15
-
-
42549164682
-
Topology study of photovoltaic interface for maximum power point tracking
-
Jun.
-
W. Xiao, N. Ozog, and W. G. Dunford, "Topology study of photovoltaic interface for maximum power point tracking," IEEE Trans. Ind. Electron., vol. 54, no. 3, pp. 1696-1704, Jun. 2007.
-
(2007)
IEEE Trans. Ind. Electron.
, vol.54
, Issue.3
, pp. 1696-1704
-
-
Xiao, W.1
Ozog, N.2
Dunford, W.G.3
-
18
-
-
3843126493
-
A thermal model for insulated gate bipolar transistor module
-
Jul.
-
Z. Luo, H. Ahn, and M. A. E. Nokali, "A thermal model for insulated gate bipolar transistor module," IEEE Trans. Power Electron., vol. 19, no. 4, pp. 902-907, Jul. 2004.
-
(2004)
IEEE Trans. Power Electron.
, vol.19
, Issue.4
, pp. 902-907
-
-
Luo, Z.1
Ahn, H.2
Nokali, M.A.E.3
-
20
-
-
0344715433
-
Reliability Prediction of Electronic Equipment
-
U.S. DOD, Washington, DC, Feb.
-
U.S. DOD, Military Handbook MIL-HDBK-217 Notice 2, Reliability Prediction of Electronic Equipment Washington, DC, Feb. 1995.
-
(1995)
Military Handbook MIL-HDBK-217 Notice 2
-
-
-
21
-
-
0003884057
-
Reliability Prediction of Electronic Equipment
-
U.S. DOD, Washington, DC, Dec.
-
U.S. DOD, Military Handbook MIL-HDBK-217F, Reliability Prediction of Electronic Equipment Washington, DC, Dec. 1991.
-
(1991)
Military Handbook MIL-HDBK-217F
-
-
-
22
-
-
20544461000
-
Deriving life multipliers for electrolytic capacitors
-
Feb.
-
S. G. Parler, Jr., "Deriving life multipliers for electrolytic capacitors," IEEE Power Electron. Soc. Newslett., vol. 16, no. 1, pp. 11-12, Feb. 2004.
-
(2004)
IEEE Power Electron. Soc. Newslett.
, vol.16
, Issue.1
, pp. 11-12
-
-
Parler Jr., S.G.1
-
23
-
-
79953779437
-
Toward a BITE for real-time life estimation of capacitors subjected to thermal stress
-
May
-
A. Albertini, M. G. Masi, G. Mazzanti, L. Peretto, and R. Tinarelli, "Toward a BITE for real-time life estimation of capacitors subjected to thermal stress," IEEE Trans. Instrum. Meas., vol. 60, no. 5, pp. 1674-1681, May 2011.
-
(2011)
IEEE Trans. Instrum. Meas.
, vol.60
, Issue.5
, pp. 1674-1681
-
-
Albertini, A.1
Masi, M.G.2
Mazzanti, G.3
Peretto, L.4
Tinarelli, R.5
-
25
-
-
10944248389
-
-
Liberty, SC: Cornell Dubilier, [Online]. Available
-
Application Guide, Aluminum Electrolytic Capacitors. Liberty, SC: Cornell Dubilier, 2003 [Online]. Available: http://www.cornell-dubilier.com/appguide. pdf
-
(2003)
Application Guide, Aluminum Electrolytic Capacitors
-
-
-
26
-
-
0003427095
-
-
Hoboken, NJ: Wiley
-
A. Haldar and S. Mahadevan, Probability, Reliability, and Statistical Methods in Engineering Design . Hoboken, NJ: Wiley, 2000.
-
(2000)
Probability, Reliability, and Statistical Methods in Engineering Design
-
-
Haldar, A.1
Mahadevan, S.2
-
27
-
-
49149094645
-
Photovoltaic reliability model based on field degradation studies
-
Aug.
-
M. Vazquez and I. Rey-Stolle, "Photovoltaic reliability model based on field degradation studies," Prog. Photovolt: Res. Appl., vol. 16, no. 5, pp. 419-433, Aug. 2008.
-
(2008)
Prog. Photovolt: Res. Appl.
, vol.16
, Issue.5
, pp. 419-433
-
-
Vazquez, M.1
Rey-Stolle, I.2
-
28
-
-
0036699431
-
Incorporating aging failures in power system reliability evaluation
-
DOI 10.1109/TPWRS.2002.800989, PII 1011092002800989
-
W. Li, "Incorporating aging failure in power system reliability evaluation," IEEE Trans. Power Syst., vol. 17, no. 3, pp. 918-923, Aug. 2002. (Pubitemid 35151777)
-
(2002)
IEEE Transactions on Power Systems
, vol.17
, Issue.3
, pp. 918-923
-
-
Li, W.1
|