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Volumn 16, Issue 5, 2008, Pages 419-433

Photovoltaic module reliability model based on field degradation studies

Author keywords

Degradation; MTTF; Photovoltaic module; Reliability; Warranty

Indexed keywords

CHROMIUM COMPOUNDS; CRYSTALLINE MATERIALS; DEGRADATION; PHOTOVOLTAIC CELLS;

EID: 49149094645     PISSN: 10627995     EISSN: 1099159X     Source Type: Journal    
DOI: 10.1002/pip.825     Document Type: Article
Times cited : (261)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.