Toward a BITE for real-time life estimation of capacitors subjected to thermal stress

IEEE Transactions on Instrumentation and Measurement

Volumn 60, Issue 5, 2011, Pages 1674-1681

  Albertini, Andrea ^a   Masi, Maria Gabriella ^a   Mazzanti, Giovanni ^a   Peretto, Lorenzo ^a   Tinarelli, Roberto ^a  

^a UNIVERSITY OF BOLOGNA   (Italy)

Author keywords

Arrhenius model; capacitors; constant thermal stress; time varying thermal stress

Indexed keywords

ARRHENIUS MODELS; BUILT-IN TESTS; CONSTANT THERMAL STRESS; LIFE ESTIMATION; LIFE MODELS; MEASUREMENT CAMPAIGN; REAL-TIME DIAGNOSTICS; STRESS HISTORY; TEST SYSTEMS; TIME TO FAILURE; TIME-VARYING TEMPERATURES; TIME-VARYING THERMAL STRESS;

CAPACITORS; THERMOELASTICITY; TIME VARYING SYSTEMS;

THERMAL STRESS;

EID: 79953779437     PISSN: 00189456     EISSN: None     Source Type: Journal    
DOI: 10.1109/TIM.2010.2102392     Document Type: Article

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