Defecting controllability of bombarding graphene with different energetic atoms via reactive force field model

Journal of Applied Physics

Volumn 114, Issue 5, 2013, Pages

  Liu, Xiao Yi ^a   Wang, Feng Chao ^a   Park, Harold S ^b   Wu, Heng An ^a  

^a UNIVERSITY OF SCIENCE AND TECHNOLOGY OF CHINA   (China)

^b Boston University   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC BOMBARDMENT; CLASSICAL MOLECULAR DYNAMICS; CONTROLLABILITY ANALYSIS; HIGH-ELECTRON-DENSITY; INCIDENT ENERGY; LOWER PROBABILITIES; REACTIVE FORCE FIELD; SINGLE VACANCIES;

ATOMS; CONTROLLABILITY; DEFECTS; MOLECULAR DYNAMICS; PROBABILITY;

GRAPHENE;

EID: 84882274530     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.4817790     Document Type: Article

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