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Volumn 5, Issue 8, 2013, Pages 3346-3351
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Temperature tuned defect induced magnetism in reduced graphene oxide
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Author keywords
[No Author keywords available]
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Indexed keywords
DEVICE APPLICATION;
EFFECT OF TEMPERATURE;
ELEVATED TEMPERATURE;
INDUCED MAGNETISM;
MEMORY APPLICATIONS;
REDUCED GRAPHENE OXIDES;
TEMPERATURE TUNED;
THEORETICAL STUDY;
FERROMAGNETISM;
GRAPHENE;
REPAIR;
DEFECTS;
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EID: 84880908055
PISSN: 20403364
EISSN: 20403372
Source Type: Journal
DOI: 10.1039/c3nr34291c Document Type: Article |
Times cited : (97)
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References (27)
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