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Volumn 103, Issue 6, 2013, Pages

Degradation mechanism in simplified phosphorescent organic light-emitting devices utilizing one material for hole transport and emitter host

Author keywords

[No Author keywords available]

Indexed keywords

DEGRADATION MECHANISM; DEGRADATION PROCESS; DEVICE LIFETIME; EMISSION LAYERS; HOLE TRANSPORTS; INDIUM TIN OXIDE; ORGANIC LIGHT-EMITTING DEVICES; PHOLEDS;

EID: 84881633603     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.4817918     Document Type: Article
Times cited : (17)

References (16)
  • 12
  • 16
    • 84881651965 scopus 로고    scopus 로고
    • See supplementary material at http://dx.doi.org/10.1063/1.4817918 E-APPLAB-103-057332 for the EL stabilities of the devices with various CBP thicknesses.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.