Exciton diffusion lengths of organic semiconductor thin films measured by spectrally resolved photoluminescence quenching

Journal of Applied Physics

Volumn 105, Issue 5, 2009, Pages

  Lunt, Richard R ^a,b   Giebink, Noel C ^a,b   Belak, Anna A ^b   Benziger, Jay B ^a   Forrest, Stephen R ^b  

^a Princeton University   (United States)

^b UNIVERSITY OF MICHIGAN   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

AGGLOMERATION; CRYSTAL ORIENTATION; DIFFUSION; ELECTRIC CONDUCTIVITY; EXCITONS; PHOTOLUMINESCENCE; QUENCHING; SINGLE CRYSTALS; THIN FILM DEVICES; THIN FILMS;

DIFFUSION LENGTHS; EXCITON DIFFUSION LENGTHS; ORGANIC SEMICONDUCTOR THIN FILMS; ORGANIC SEMICONDUCTORS; PHOTOLUMINESCENCE QUENCHING; POLYCRYSTALLINE FILMS;

SEMICONDUCTING ORGANIC COMPOUNDS;

EID: 62549113492     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3079797     Document Type: Article

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