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Volumn 97, Issue 6, 2010, Pages

Photodegradation of the organic/metal cathode interface in organic light-emitting devices

Author keywords

[No Author keywords available]

Indexed keywords

DEGRADATION MECHANISM; DEVICE PERFORMANCE; DRIVING VOLTAGES; EXTERNAL ILLUMINATION; ORGANIC LIGHT-EMITTING DEVICES; ORGANIC OPTOELECTRONICS; PHOTO-STABILITY; PHOTOINDUCED DEGRADATION; PHOTOVOLTAIC DEVICES;

EID: 77955753800     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3480412     Document Type: Article
Times cited : (34)

References (14)
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  • 2
    • 33747114697 scopus 로고    scopus 로고
    • Ultrastable and efficient red organic light emitting diodes with doped transport layers
    • DOI 10.1063/1.2268354
    • R. Meerheim, K. Walzer, M. Pfeiffer, and K. Leo, Appl. Phys. Lett. APPLAB 0003-6951 89, 061111 (2006). 10.1063/1.2268354 (Pubitemid 44222896)
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    • Meerheim, R.1    Walzer, K.2    Pfeiffer, M.3    Leo, K.4
  • 4
    • 33847754274 scopus 로고    scopus 로고
    • Operational degradation of organic light-emitting diodes: Mechanism and identification of chemical products
    • DOI 10.1063/1.2430922
    • D. Y. Kondakov, W. C. Lenhart, and W. F. Nichols, J. Appl. Phys. JAPIAU 0021-8979 101, 024512 (2007). 10.1063/1.2430922 (Pubitemid 46372866)
    • (2007) Journal of Applied Physics , vol.101 , Issue.2 , pp. 024512
    • Kondakov, D.Y.1    Lenhart, W.C.2    Nichols, W.F.3
  • 6
    • 0001746946 scopus 로고    scopus 로고
    • Degradation processes at the cathode/organic interface in organic light emitting devices with Mg:Ag cathodes
    • DOI 10.1063/1.121442, PII S0003695198024218
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    • (1998) Applied Physics Letters , vol.72 , Issue.21 , pp. 2642-2644
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  • 7
    • 0031998188 scopus 로고    scopus 로고
    • Humidity-induced crystallization of tris (8-hydroxyquinoline) aluminum layers in organic light-emitting devices
    • DOI 10.1063/1.120867, PII S0003695198004070
    • H. Aziz, Z. Popovic, S. Xie, C. P. Tripp, N. Hu, A. Hor, and G. Xu, Appl. Phys. Lett. APPLAB 0003-6951 72, 756 (1998). 10.1063/1.120867 (Pubitemid 128674040)
    • (1998) Applied Physics Letters , vol.72 , Issue.7 , pp. 756-758
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  • 12
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    • Effects of interfacial stability between electron transporting layer and cathode on the degradation process of organic light-emitting diodes
    • DOI 10.1063/1.2817939
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.