Coherent topological transport on the surface of Bi2Se3

Nature Communications

Volumn 4, Issue , 2013, Pages

  Kim, Dohun ^a   Syers, Paul ^a   Butch, Nicholas P ^b   Paglione, Johnpierre ^a   Fuhrer, Michael S ^a,c  

^a Bldg 142   (United States)

^b LAWRENCE LIVERMORE NATIONAL LABORATORY   (United States)

^c MONASH UNIVERSITY   (Australia)

Author keywords

[No Author keywords available]

Indexed keywords

BISMUTH DERIVATIVE; SELENIDE;

INSULATION; QUANTITATIVE ANALYSIS; THREE-DIMENSIONAL MODELING; TOPOLOGY;

ARTICLE; ATOMIC FORCE MICROSCOPY; CONDUCTANCE; ELECTRON; ELECTRON TRANSPORT; FIELD EFFECT TRANSISTOR; HYBRIDIZATION; SURFACE PROPERTY; THICKNESS;

EID: 84881163564     PISSN: None     EISSN: 20411723     Source Type: Journal    
DOI: 10.1038/ncomms3040     Document Type: Article

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