-
1
-
-
0345979435
-
-
A. Ulman Chem. Rev. 1996 96 1533 1554
-
(1996)
Chem. Rev.
, vol.96
, pp. 1533-1554
-
-
Ulman, A.1
-
6
-
-
5844253085
-
-
K. A. Bell L. Mantese U. Rossow D. E. Aspnes J. Vac. Sci. Technol., B: Microelectron. Nanometer Struct.-Process., Meas., Phenom. 1997 15 1205 1211
-
(1997)
J. Vac. Sci. Technol., B: Microelectron. Nanometer Struct.-Process., Meas., Phenom.
, vol.15
, pp. 1205-1211
-
-
Bell, K.A.1
Mantese, L.2
Rossow, U.3
Aspnes, D.E.4
-
8
-
-
4344704896
-
-
L. J. Richter C. S.-C. Yang P. T. Wilson C. A. Hacker R. D. van Zee J. J. Stapleton D. L. Allara Y. Yao J. M. Tour J. Phys. Chem. B 2004 108 12547 12559
-
(2004)
J. Phys. Chem. B
, vol.108
, pp. 12547-12559
-
-
Richter, L.J.1
Yang, C.S.-C.2
Wilson, P.T.3
Hacker, C.A.4
Van Zee, R.D.5
Stapleton, J.J.6
Allara, D.L.7
Yao, Y.8
Tour, J.M.9
-
11
-
-
56349115803
-
-
H. Hamoudi Z. Guo M. Prato C. Dablemont W. Q. Zheng B. Bourguignon M. Canepa V. A. Esaulov Phys. Chem. Chem. Phys. 2008 10 6836 6841
-
(2008)
Phys. Chem. Chem. Phys.
, vol.10
, pp. 6836-6841
-
-
Hamoudi, H.1
Guo, Z.2
Prato, M.3
Dablemont, C.4
Zheng, W.Q.5
Bourguignon, B.6
Canepa, M.7
Esaulov, V.A.8
-
12
-
-
71049186782
-
-
M. Prato M. Alloisio S. A. Jadhav A. Chincarini T. Svaldo-Lanero F. Bisio O. Cavalleri M. Canepa J. Phys. Chem. C 2009 113 20683 20688
-
(2009)
J. Phys. Chem. C
, vol.113
, pp. 20683-20688
-
-
Prato, M.1
Alloisio, M.2
Jadhav, S.A.3
Chincarini, A.4
Svaldo-Lanero, T.5
Bisio, F.6
Cavalleri, O.7
Canepa, M.8
-
30
-
-
84882904739
-
-
Andrew, Norwich, 1st edn
-
Handbook of ellipsometry, ed., H. Tompkins, and, E. Irene, Andrew, Norwich, 1st edn, 2005
-
(2005)
Handbook of Ellipsometry
-
-
Tompkins, H.1
Irene, E.2
-
31
-
-
84889844015
-
-
Wiley, Chichester, United Kingdom, 1st edn
-
H. Fujiwara, Spectroscopic Ellipsometry: Principles and Applications, Wiley, Chichester, United Kingdom, 1st edn, 2007
-
(2007)
Spectroscopic Ellipsometry: Principles and Applications
-
-
Fujiwara, H.1
-
32
-
-
70349756806
-
-
M. Losurdo M. Bergmair G. Bruno D. Cattelan C. Cobet A. de Martino K. Fleischer Z. Dohcevic-Mitrovic N. Esser M. Galliet R. Gajic D. Hemzal K. Hingerl J. Humlicek R. Ossikovski Z. V. Popovic O. Saxl J. Nanopart. Res. 2009 11 1521 1554
-
(2009)
J. Nanopart. Res.
, vol.11
, pp. 1521-1554
-
-
Losurdo, M.1
Bergmair, M.2
Bruno, G.3
Cattelan, D.4
Cobet, C.5
De Martino, A.6
Fleischer, K.7
Dohcevic-Mitrovic, Z.8
Esser, N.9
Galliet, M.10
Gajic, R.11
Hemzal, D.12
Hingerl, K.13
Humlicek, J.14
Ossikovski, R.15
Popovic, Z.V.16
Saxl, O.17
-
34
-
-
84894325493
-
-
ed. G. Bracco and B. Holst, Springer Series in Surface Sciences, Berlin, Germany, 1st edn, 51
-
M. Canepa, in A Surface Scientist's View of Spectroscopic Ellipsometry, ed., G. Bracco, and, B. Holst, Springer Series in Surface Sciences, Berlin, Germany, 1st edn, 2013, vol. 51
-
(2013)
A Surface Scientist's View of Spectroscopic Ellipsometry
-
-
Canepa, M.1
-
35
-
-
84856356389
-
-
M. Prato C. Toccafondi G. Maidecchi V. Chaudhari M. N. K. Harish S. Sampath R. Parodi V. A. Esaulov M. Canepa J. Phys. Chem. C 2012 116 2431 2437
-
(2012)
J. Phys. Chem. C
, vol.116
, pp. 2431-2437
-
-
Prato, M.1
Toccafondi, C.2
Maidecchi, G.3
Chaudhari, V.4
Harish, M.N.K.5
Sampath, S.6
Parodi, R.7
Esaulov, V.A.8
Canepa, M.9
-
41
-
-
3442898749
-
-
J. D. Monnell J. J. Stapleton J. J. Jackiw T. Dunbar W. A. Reinerth S. M. Dirk J. M. Tour D. L. Allara P. S. Weiss J. Phys. Chem. B 2004 108 9834 9841
-
(2004)
J. Phys. Chem. B
, vol.108
, pp. 9834-9841
-
-
Monnell, J.D.1
Stapleton, J.J.2
Jackiw, J.J.3
Dunbar, T.4
Reinerth, W.A.5
Dirk, S.M.6
Tour, J.M.7
Allara, D.L.8
Weiss, P.S.9
-
46
-
-
77954729193
-
-
F. Bisio M. Palombo M. Prato O. Cavalleri E. Barborini S. Vinati M. Franchi L. Mattera M. Canepa Phys. Rev. B: Condens. Matter Mater. Phys. 2009 80 205428
-
(2009)
Phys. Rev. B: Condens. Matter Mater. Phys.
, vol.80
, pp. 205428
-
-
Bisio, F.1
Palombo, M.2
Prato, M.3
Cavalleri, O.4
Barborini, E.5
Vinati, S.6
Franchi, M.7
Mattera, L.8
Canepa, M.9
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