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Volumn 282, Issue , 2013, Pages 92-97
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Characteristics of p-type transparent conductive CuCrO 2 thin films
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Author keywords
Copper chromium oxide; Optoelectronic properties; Sputtering; Structure; Subband; Transparent conductive oxide; X ray diffraction
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Indexed keywords
AMORPHOUS FILMS;
ANNEALING;
CONDUCTIVE FILMS;
COPPER OXIDES;
ENERGY GAP;
POINT DEFECTS;
SPUTTERING;
STRUCTURE (COMPOSITION);
THIN FILMS;
X RAY DIFFRACTION;
COPPER CHROMIUM;
MICRO-STRUCTURAL PROPERTIES;
OPTOELECTRONIC PROPERTIES;
REACTIVE MAGNETRON SPUTTERING DEPOSITION;
ROOT MEAN SQUARE ROUGHNESS;
SUBBANDS;
TRANSPARENT CONDUCTIVE OXIDES;
VISIBLE-WAVELENGTH RANGE;
CHROMIUM COMPOUNDS;
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EID: 84880930343
PISSN: 01694332
EISSN: None
Source Type: Journal
DOI: 10.1016/j.apsusc.2013.05.061 Document Type: Article |
Times cited : (64)
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References (22)
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