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Volumn 282, Issue , 2013, Pages 590-594
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Thermoelectric properties of V 2 O 5 thin films deposited by thermal evaporation
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Author keywords
Thermal evaporation; Thermoelectric properties; Thin films; Vanadium pentoxide
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Indexed keywords
AMORPHOUS FILMS;
ELECTRIC CONDUCTIVITY;
ENERGY GAP;
SUBSTRATES;
THERMAL EVAPORATION;
THERMOELECTRIC EQUIPMENT;
THERMOELECTRICITY;
THIN FILMS;
VANADIUM PENTOXIDE;
ANNEALING TEMPERATURES;
ATMOSPHERIC CONDITIONS;
CORNING GLASS;
ELECTRICAL CONDUCTIVITY;
GRAIN SIZE;
POST-DEPOSITION;
THERMOELECTRIC PROPERTIES;
V2O5 THIN FILMS;
OPTICAL FILMS;
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EID: 84880928318
PISSN: 01694332
EISSN: None
Source Type: Journal
DOI: 10.1016/j.apsusc.2013.06.016 Document Type: Article |
Times cited : (83)
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References (22)
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