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Volumn 253, Issue 17, 2007, Pages 7094-7099
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Crystallization and electrical properties of V 2 O 5 thin films prepared by RF sputtering
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Author keywords
Electrical properties; RF sputtering; Thin films; Vanadium pentoxide
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Indexed keywords
ACTIVATION ENERGY;
CRYSTALLIZATION;
ELECTRIC CONDUCTIVITY;
FILM THICKNESS;
GRAIN BOUNDARIES;
MICROSTRUCTURE;
REACTIVE SPUTTERING;
VANADIUM COMPOUNDS;
X RAY DIFFRACTION;
DARK CONDUCTIVITY;
FUCHS-SONDHEIMER RELATION;
POTENTIAL BARRIER HEIGHT;
RF SPUTTERING;
VANADIUM PENTOXIDE;
THIN FILMS;
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EID: 34249036835
PISSN: 01694332
EISSN: None
Source Type: Journal
DOI: 10.1016/j.apsusc.2007.02.054 Document Type: Article |
Times cited : (27)
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References (20)
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