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Volumn 253, Issue 17, 2007, Pages 7094-7099

Crystallization and electrical properties of V 2 O 5 thin films prepared by RF sputtering

Author keywords

Electrical properties; RF sputtering; Thin films; Vanadium pentoxide

Indexed keywords

ACTIVATION ENERGY; CRYSTALLIZATION; ELECTRIC CONDUCTIVITY; FILM THICKNESS; GRAIN BOUNDARIES; MICROSTRUCTURE; REACTIVE SPUTTERING; VANADIUM COMPOUNDS; X RAY DIFFRACTION;

EID: 34249036835     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.apsusc.2007.02.054     Document Type: Article
Times cited : (27)

References (20)
  • 15
    • 33749147037 scopus 로고
    • Thin Solid Films
    • Gould G.N., and Moraga L.A. Thin Solid Films. 10 (1972) 327
    • (1972) 10 , pp. 327
    • Gould, G.N.1    Moraga, L.A.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.