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Volumn 4, Issue 14, 2013, Pages 2371-2376

On the differences between dark and light ideality factor in polymer:Fullerene solar cells

Author keywords

current voltage curve; defects; drift diffusion simulations; open circuit voltage; resistive effects; surface recombination; traps

Indexed keywords

BULK RECOMBINATION; DRIFT-DIFFUSION SIMULATION; IDEALITY FACTORS; INTERNAL DONOR; LIGHT INTENSITY; RESISTIVE EFFECTS; SURFACE RECOMBINATIONS; TRAPS;

EID: 84880555406     PISSN: None     EISSN: 19487185     Source Type: Journal    
DOI: 10.1021/jz4012146     Document Type: Article
Times cited : (244)

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