Purification of melt-spun metallurgical grade silicon micro-flakes through a multi-step segregation procedure

Journal of Crystal Growth

Volumn 363, Issue , 2013, Pages 33-39

  Martinsen, F A ^a   Nordstrand, E F ^a   Gibson, U J ^a  

^a NORWEGIAN UNIVERSITY OF SCIENCE AND TECHNOLOGY   (Norway)

Author keywords

A1. Impurities; A1. Segregation; A1. Solidification; A2. Single crystal growth; B1. Silicon; B3. Solar cells

Indexed keywords

CRYSTAL IMPURITIES; DROPS; GRAIN BOUNDARIES; HYDROFLUORIC ACID; IMPURITIES; INDUCTIVELY COUPLED PLASMA; MASS SPECTROMETERS; MASS SPECTROMETRY; MELT SPINNING; METALLURGY; PURIFICATION; REMOVAL; SECONDARY ION MASS SPECTROMETRY; SILICON; SINGLE CRYSTALS; SOLIDIFICATION; SURFACE SEGREGATION;

BACKSCATTERED ELECTRON IMAGING; ELECTRON BACK-SCATTERED DIFFRACTION; INDUCTIVELY COUPLED PLASMA MASS SPECTROSCOPIES; METALLURGICAL GRADE SILICONS (MGSI); ORDERS OF MAGNITUDE; OXIDATION ANNEALING; PURIFICATION EFFECT; SECONDARY ION MASS SPECTROSCOPIES (SIMS);

SEGREGATION (METALLOGRAPHY);

EID: 84880433908     PISSN: 00220248     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jcrysgro.2012.09.033     Document Type: Article

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